| 制造商 | 部件名 | 数据表 | 功能描述 |

Sanyo Semicon Device
|
LC7073 |
193Kb/11P |
Error Detection Correction LSIs for RDS Demodulators |
| LC7070N |
195Kb/8P |
Sync and Error Detection & Correction LSIs for RDS |

Micrel Semiconductor
|
SY10E193 |
62Kb/4P |
ERROR DETECTION/ CORRECTION CIRCUIT |

ON Semiconductor
|
MC10E193 |
108Kb/4P |
ERROR DETECTION/ CORRECTION CIRCUIT REV 3 |

Micrel Semiconductor
|
SY10E193 |
65Kb/5P |
ERROR DETECTION/CORRECTION CIRCUIT |

Intersil Corporation
|
ACTS630MS |
489Kb/4P |
Radiation Hardened EDAC (Error Detection and Correction) January 1996 |

Panasonic Semiconductor
|
MN1380 |
157Kb/20P |
CMOS LSIs for Voltage Detection |

Renesas Technology Corp
|
ACTS630MS |
683Kb/4P |
Radiation Hardened EDAC (Error Detection and Correction) January 1996 |

Dynex Semiconductor
|
MA31755 |
134Kb/13P |
16-Bit Feedthrough Error Detection & Correction Unit EDAC |

Renesas Technology Corp
|
ACS630MS |
676Kb/3P |
Radiation Hardened EDAC (Error Detection and Correction Circuit) January 1996 |

Texas Instruments
|
SN54LS630 |
352Kb/9P |
16-BIT PARALLEL ERROR DETECTION AND CORRECTION CIRCUITS |

National Semiconductor ...
|
DP8406 |
225Kb/14P |
32-Bit Parallel Error Detection and Correction Circuit |

Integrated Device Techn...
|
IDT49C460 |
714Kb/32P |
32-BIT CMOS ERROR DETECTION AND CORRECTION UNIT |

Intersil Corporation
|
ACS630MS |
489Kb/4P |
Radiation Hardened EDAC (Error Detection and Correction Circuit) January 1996 |

Integrated Device Techn...
|
IDT49C466 |
234Kb/27P |
64-BIT FLOW-THRU ERROR DETECTION AND CORRECTION UNIT |
| IDT49C465 |
402Kb/38P |
32-BIT FLOW-THRU ERROR DETECTION AND CORRECTION UNIT |

ATMEL Corporation
|
29C516E |
163Kb/17P |
16-Bit Flow-Through EDAC Error Detection And Correction unit |
| 29C516E |
94Kb/16P |
16 Bit Flow Through EDAC Error Detection And Correction unit |

STMicroelectronics
|
AN2440 |
246Kb/13P |
The Error Code Correction |

Sanyo Semicon Device
|
LC7074M |
373Kb/18P |
Synchronous Error Correction LSI for RDS Applications |