制造商 | 部件名 | 数据表 | 功能描述 |
Texas Instruments |
SN74BCT8373
|
293Kb / 21P |
[Old version datasheet] SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
|
SN54BCT8244A
|
472Kb / 26P |
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL BUFFERS
|
SN54BCT8244A
|
612Kb / 28P |
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL BUFFERS
|
SN54BCT8244A
|
642Kb / 28P |
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL BUFFERS
|
SN54BCT8374A
|
474Kb / 26P |
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN54BCT8374A
|
644Kb / 28P |
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
|
SN54BCT8245A
|
309Kb / 22P |
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
|
SN54BCT8240A
|
473Kb / 26P |
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
|
SN54ABT8245
|
635Kb / 30P |
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
|
SN54BCT8245A
|
658Kb / 29P |
[Old version datasheet] SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
|