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AM79C930VCW 数据表(PDF) 139 Page - Advanced Micro Devices |
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AM79C930VCW 数据表(HTML) 139 Page - Advanced Micro Devices |
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139 / 161 page  P R E L I M I N A R Y AMD 139 Am79C930 AC CHARACTERISTICS 3.3 V MEMORY BUS INTERFACE ABSOLUTE MAXIMUM RATINGS Storage Temperature: –65 to +150 °C . . . . . . . . . . . . Ambient Temperature Under Bias: –65 to +125 °C . . . Supply Voltage to AVSS or DVSS (AVDD, DVDD): –0.3 to +6 V . . . . . . . . . . . . . . Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. OPERATING RANGES Commercial (C) Devices Temperature (TA)0 °C to + 70°C . . . . . . . . . . . . . . . . . Supply Voltages (VCC,VDDT, VDDU1, VDDU2, VDDM, VDDP) 3.0 V to 5.25 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Supply Voltages (AVDD, VDD5) +5 V ± 5% . . . . . . . . . . . . . . . . . . . . . . . . All inputs within the range: VSS – 0.5 V ≤ V IN ≤ V DD + 0.1 X VDD – where VSS and VDD are appropriate reference pins for a given input pin. (See section on power supply pin descriptions.) CL = 50 pF unless otherwise noted Operating ranges define those limits between which the func- tionality of the device is guaranteed. MEMORY BUS READ ACCESS Parameter Symbol Parameter Description Test Conditions Min Max Unit tmAD MA[16:0] valid from CLKIN ↓ 2 100 ns tmCD CE active delay from CLKIN ↓ Note 1 2 100 ns tmOD MOE active delay from CLKIN ↓ 2 100 ns tmOLZ MOE ↓ to MD[7:0] driven 0 wait states 0 70 ns (Note 3) 1 wait state 170 ns 2 wait states 270 ns tmAA Address Read Access Time 0 wait states 120 ns (Note 3) 1 wait state 220 ns 2 wait states 320 ns tmACS CE Read Access Time 0 wait states 120 ns (Notes 1, 3) 1 wait state 220 ns 2 wait states 320 ns tmOE MOE Read Access Time 0 wait states 70 ns (Note 3) 1 wait state 170 ns 2 wait states 270 ns tmRI CE Inactive Time Notes 1, 2 0 ns tmAH MA[16:0] valid hold from MOE ↑ Note 1 TCLKIN-10 ns tmCH CE valid hold from MOE ↑ TCLKIN-10 ns tmH MD[7:0] valid hold from MOE ↑ Note 2 0 ns tmHZ MD[7:0] inactive from MOE ↑ Note 2 0 2 X TCLKIN-15 ns Notes: 1. CE = one of: FCE, SCE, XCE 2. Parameter not included in the production test. 3. Value is dependent upon TCLKIN value. Value given is for CLKIN = 20 MHz. |
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