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数据搜索系统，热门电子元器件搜索 |
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数据搜索系统，热门电子元器件搜索 |
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ST72C254G2 数据表(PDF) 101 Page - STMicroelectronics |
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ST72C254G2 数据表(HTML) 101 Page - STMicroelectronics |
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101 / 140 page  ST72104G, ST72215G, ST72216G, ST72254G 101/140 FUNCTIONAL OPERATING CONDITIONS (Cont’d) Figure 56. High LVD Threshold Versus V DD and f OSC for ROM devices 2) Figure 57. Medium LVD Threshold Versus V DD and f OSC for ROM devices 2) Figure 58. Low LVD Threshold Versus VDD and fOSC for ROM devices 2)3) Notes: 1. LVD typical data are based on TA=25°C. They are given only as design guidelines and are not tested. 2. The minimum VDD rise time rate is needed to insure a correct device power-on and LVD reset. Not tested in production. 3. If the low LVD threshold is selected, when VDD falls below 3.2V, the device is guaranteed to be either functioning or under reset. fOSC [MHz] SUPPLY VOLTAGE [V] 16 8 0 2.5 3 3.5 4 4.5 5 5.5 FUNCTIONAL AREA DEVICE UNDER RESET IN THIS AREA FUNCTIONALITY NOT GUARANTEED IN THIS AREA VIT-≥3.85 fOSC [MHz] SUPPLY VOLTAGE [V] 16 8 0 2.5 3 VIT-≥3.5V 4 4.5 5 5.5 FUNCTIONAL AREA DEVICE UNDER RESET IN THIS AREA FUNCTIONALITY NOT GUARANTEED IN THIS AREA fOSC [MHz] SUPPLY VOLTAGE [V] 16 8 0 2.5 VIT-≥3.00V 3.5 4 4.5 5 5.5 FUNCTIONAL AREA DEVICE UNDER RESET IN THIS AREA FUNCTIONALITY NOT GUARANTEED IN THIS AREA |
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