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AT83SND1CXXX-ROTIL 数据表(PDF) 182 Page - ATMEL Corporation |
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AT83SND1CXXX-ROTIL 数据表(HTML) 182 Page - ATMEL Corporation |
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182 / 212 page ![]() 182 4109J–8051–10/06 AT8xC51SND1C 22.2.1.1 I DD, IDL and IPD Test Conditions Figure 22-1. I DD Test Condition, Active Mode Figure 22-2. IDL Test Condition, Idle Mode Figure 22-3. I PD Test Condition, Power-Down Mode RST TST P0 All other pins are unconnected VDD VDD VDD I DD VDD PVDD UVDD AVDD X2 Clock Signal VSS X1 (NC) VSS PVSS UVSS AVSS X2 VDD Clock Signal RST VSS TST X1 P0 (NC) IDL All other pins are unconnected VSS VDD VSS VDD PVDD UVDD AVDD PVSS UVSS AVSS RST MCMD P0 All other pins are unconnected VSS VDD TST MDAT VDD I PD VDD PVDD UVDD AVDD X2 VSS X1 (NC) VSS PVSS UVSS AVSS |
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