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STM32L412R8I6TR 数据表(PDF) 129 Page - STMicroelectronics

部件名 STM32L412R8I6TR
功能描述  Ultra-low-power Arm® Cortex®-M4 32-bit MCUFPU, 100DMIPS, up to 128KB Flash, 40KB SRAM, analog, ext. SMPS
PDF  192 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

STM32L412R8I6TR 数据表(HTML) 129 Page - STMicroelectronics

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DS12469 Rev 4
129/192
STM32L412xx
Electrical characteristics
163
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
A supply overvoltage is applied to each power supply pin.
A current injection is applied to each input, output and configurable I/O pin.
These tests are compliant with EIA/JESD 78A IC latch-up standard.
6.3.13
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDDIOx (for standard, 3.3 V-capable I/O pins) should be avoided during normal
product operation. However, in order to give an indication of the robustness of the
microcontroller in cases when abnormal injection accidentally happens, susceptibility tests
are performed on a sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of the -5 µA/+0 µA range) or other functional failure (for example reset occurrence or
oscillator frequency deviation).
The characterization results are given in Table 68.
Negative induced leakage current is caused by negative injection and positive induced
leakage current is caused by positive injection.
Table 67. Electrical sensitivities
Symbol
Parameter
Conditions
Class
LU
Static latch-up class
TA = +105 °C conforming to JESD78A
II
Table 68. I/O current injection susceptibility(1)
1. Guaranteed by characterization results.
Symbol
Description
Functional
susceptibility
Unit
Negative
injection
Positive
injection
IINJ
Injected current on all pins except PA4, PA5
-5
N/A(2)
2. Injection is not possible.
mA
Injected current on PA4, PA5 pins
-5
0



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