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STM32L433CCU6P 数据表(PDF) 145 Page - STMicroelectronics |
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STM32L433CCU6P 数据表(HTML) 145 Page - STMicroelectronics |
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145 / 227 page ![]() DS11449 Rev 7 145/19 STM32L433xx Electrical characteristics 194 Prequalification trials Most of the common failures (unexpected reset and program counter corruption) can be reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1 second. To complete these trials, ESD stress can be applied directly on the device, over the range of specification values. When unexpected behavior is detected, the software can be hardened to prevent unrecoverable errors occurring (see application note AN1015). Electromagnetic Interference (EMI) The electromagnetic field emitted by the device are monitored while a simple application is executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with IEC 61967-2 standard which specifies the test board and the pin loading. 6.3.12 Electrical sensitivity characteristics Based on three different tests (ESD, LU) using specific measurement methods, the device is stressed in order to determine its performance in terms of electrical sensitivity. Electrostatic discharge (ESD) Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according to each pin combination. The sample size depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test conforms to the ANSI/JEDEC standard. Table 66. EMI characteristics for fHSE = 8 MHz and fHCLK = 80 MHz Symbol Parameter Conditions Monitored frequency band Value Unit SEMI Peak(1) 1. Refer to AN1709 “EMI radiated test” section. VDD = 3.6 V, TA = 25 °C, LQFP100 package compliant with IEC 61967-2 0.1 MHz to 30 MHz -8 dBµV 30 MHz to 130 MHz 2 130 MHz to 1 GHz 5 1 GHz to 2 GHz 8 Level(2) 2. Refer to AN1709 “EMI level classification” section. 0.1 MHz to 30 MHz 2.5 - Table 67. ESD absolute maximum ratings Symbol Ratings Conditions Class Maximum value(1) 1. Guaranteed by characterization results. Unit VESD(HBM) Electrostatic discharge voltage (human body model) TA = +25 °C, conforming to ANSI/ESDA/JEDEC JS-001 2 2000 V VESD(CDM) Electrostatic discharge voltage (charge device model) TA = +25 °C, conforming to ANSI/ESD STM5.3.1 C3 250 |
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