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H8SX/1663R 数据表(PDF) 1237 Page - Renesas Technology Corp |
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H8SX/1663R 数据表(HTML) 1237 Page - Renesas Technology Corp |
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1237 / 1504 page ![]() Section 26 Boundary Scan Rev. 2.00 Sep. 24, 2008 Page 1205 of 1468 REJ09B0412-0200 Section 26 Boundary Scan This LSI has boundary scan function, which is a serial I/O interface based on the JTAG (Joint Test Action Group, IEEE Std.1149.1 and IEEE Standard Test Access Port and Boundary-Scan Architecture). 26.1 Features • Boundary scan valid single chip mode when the EMLE pin= 0 in MCU operating mode 3 • P62, P63, P64, P65, and WDTOVF are pins only for boundary scan when boundary scan is valid • Six test modes: BYPASS mode EXTEST mode SAMPLE/PRELOAD mode CLAMP mode HIGHZ mode IDCODE mode |
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