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STM32L152C6 数据表(PDF) 119 Page - STMicroelectronics |
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STM32L152C6 数据表(HTML) 119 Page - STMicroelectronics |
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119 / 121 page ![]() STM32L151x6/8/B, STM32L152x6/8/B Revision history Doc ID 17659 Rev 8 119/121 17-June-2011 5 Modified 1st page (low power features) Added STM32L15xC6 and STM32L15xR6 devices (32 Kbytes of Flash memory). Modified Section 3.6: GPIOs (general-purpose inputs/outputs) on page 22 Modified Section 6.3: Operating conditions on page 50 Modified Table 55: ADC accuracy on page 92, Table 57: DAC characteristics on page 96 and Table 59: Comparator 1 characteristics on page 99 25-Jan-2012 6 Features: updated internal multispeed low power RC. Table 2: Ultra-low-power STM32L15xxx device features and peripheral counts: LCD 4x44 and 8x40 available for both 64- and 128-Kbyte devices; two comparators available for all devices. Figure 8: STM32L15xCx UFQFPN48 pinout: replaced VFQPN48 by UFQFPN48 as name of package. Table 9: STM32L15xxx pin definitions: replaced PH0/PH1 by PC14/PC15. Table 10: Alternate function input/output: removed EVENT OUT from PH2 port, AFIO15 column. Table 13: Functionalities depending on the operating power supply range: added footnote 1. Table 19: Current consumption in Sleep mode: updated MSI conditions and fHCLK. Table 20: Current consumption in Low power run mode: updated some temperature conditions; added footnote 2. Table : : updated some temperature conditions and one of the MSI clock conditions. Table 22: Typical and maximum current consumptions in Stop mode: updated IDD (WU from Stop) parameter. Table 23: Typical and maximum current consumptions in Standby mode: updated IDD (WU from Standby) parameter. Table 24: Typical and maximum timings in Low power modes: updated fHCLK value for tWUSLEEP_LP; updated typical value of parameter “Wakeup from Stop mode, regulator in Run mode”. Table 25: Peripheral current consumption: replaced GPIOF by GPIOH. Table 33: PLL characteristics: updated “PLL output clock” Table 35: Flash memory and data EEPROM characteristics: updated all information for IDD. Figure 18: I/O AC characteristics definition: replaced the falling edge “tr(IO)out” by “tf(IO)out”. Table 47: I2C characteristics: amended footnote 2. Table 54: ADC characteristics: updated fS max value for direct channels, 6-bit sampling rate. Table 55: ADC accuracy: Updated the first, third and fourth fADC test condition. Table 58: Temperature sensor characteristics: updated typ, min, and max values of the TS_temp parameter. Table 70. Document revision history (continued) Date Revision Changes |
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