Features
• QML Qualified Per MIL-PRF-38535 Requirements
• 1.25Micron Radiation Hardened SOS CMOS
• Radiation Environment
- Latch-up Free Under any Conditions
- Total Dose . . . . . . . . . . . . . . . . . . . . . 3 x 105 RAD(Si)
- SEU Immunity . . . . . . . . . . .<1 x 10-10 Errors/Bit/Day
- SEU LET Threshold. . . . . . . . . . . >100MeV/(mg/cm2)
• Input Logic Levels. .VIL = (0.3V)(VCC), VIH = (0.7V)(VCC)
• Output Current . . . . . . . . . . . . . . . . . . . . . . . . . . . 16mA
• Quiescent Supply Current . . . . . . . . . . . . . . . . . . . 20A
• Propagation Delay . . . . . . . . . . . . . . . . . . . . . . . . . 9.0ns

Description
The Radiation Hardened ACS244MS is a Non-Inverting,
Octal, Three-State Buffer/Line Driver with two active-LOW
Enable inputs (AE and BE). Each Enable input controls four
outputs. When an Enable input is LOW, the corresponding
outputs are active. A HIGH on an Enable input causes the
corresponding outputs to be high impedance, regardless of
the input levels.
The ACS244MS is fabricated on a CMOS Silicon on Sapphire (SOS) process, which provides an immunity to Single
Event Latch-up and the capability of highly reliable performance in any radiation environment. These devices offer
significant power reduction and faster performance when
compared to ALSTTL types.
Specifications for Rad Hard QML devices are controlled
by the Defense Supply Center in Columbus (DSCC). The
SMD numbers listed below must be used when ordering.
Detailed Electrical Specifications for the ACS244 are
contained in SMD 5962-98541.