Product Description
The KX124-1051 is a tri-axis ±2g, ±4g or ±8g silicon micromachined
accelerometer with integrated 2048 byte buffer, orientation, tap/double
tap, activity detecting, and Free fall algorithms. The sense element is
fabricated using Kionix’s proprietary plasma micromachining process
technology. Acceleration sensing is based on the principle of a differential
capacitance arising from acceleration-induced motion of the sense
element, which further utilizes common mode cancellation to decrease
errors from process variation, temperature, and environmental stress. The
sense element is hermetically sealed at the wafer level by bonding a
second silicon lid wafer to the device using a glass frit. A separate ASIC
device packaged with the sense element provides signal conditioning, and
intelligent user-programmable application algorithms. The accelerometer
is delivered in a 3 x 3 x 0.9mm LGA plastic package operating from a
1.71V – 3.6V DC supply. Voltage regulators are used to maintain constant
internal operating voltages over the range of input supply voltages. This results in stable operating
characteristics over the range of input supply voltages. I2C or SPI digital protocol is used to communicate
with the chip to configure and check for updates to the orientation, Directional TapTM detection, Free fall
detection and activity monitoring algorithms.

Features
 3 x 3 x 0.9 mm LGA
 User-selectable g Range up to ± 8g
 User-selectable Output Data Rate up to 25600Hz
 User-selectable low power or high resolution mode
 Digital High-Pass Filter Outputs
 Extra large embedded 2048 byte FIFO/FILO buffer
 Low Power Consumption with FlexSet™ Performance Optimization
 Internal voltage regulator
 Enhanced integrated Free fall, Directional Tap/Double-TapTM, and Device-orientation Algorithms
 User-configurable wake-up function
 Digital I2C up to 3.4MHz
 Digital SPI up to 10MHz
 Lead-free Solderability
 Excellent Temperature Performance
 High Shock Survivability
 Factory Programmed Offset and Sensitivity
 Self-test Function