FEATURES
► High performance
► Throughput: 40 MSPS, 46.25 ns conversion latency
► INL: ±4 ppm (typical), ±8 ppm (maximum)
► SNR/THD
► 93.6 dB (typical)/−110 dB (typical) at fIN = 1 kHz
► 93.5 dB (typical)/−104 dB (typical) at fIN = 1 MHz
► Noise spectral density: −167.6 dBFS/Hz
► 20-bit resolution, no missing codes
► Low power
► 79.3 mW typical at 40 MSPS with −0.5 dBFS sine-wave input
► Easy Drive, fully differential Input
► 6 V p-p differential input range
► Continuous signal acquisition
► Linearized, 5 μA/MSPS input current
► Integrated, low-drift reference buffer and decoupling
► Integrated VCM generation
► Digital features and data interface
► Conversion result FIFO, 16K sample depth
► Digital averaging filter with up to 210 decimation
► SPI configuration
► Configurable data interface
► Single lane, DDR, serial LVDS, 800 MBPS per lane
► Dual lane, DDR, serial LVDS, 400 MBPS per lane
► Single/quad lane SPI data interface
► Package
► 49-ball, 5 mm x 5 mm CSP_BGA, 0.65 mm pitch
► Integrated supply decoupling capacitors
► Operating temperature range: −40°C to +85°C

APPLICATIONS
► Digital imaging
► Cell analysis
► Spectroscopy
► Automated test equipment
► High speed data acquisition
► Digital control loops, hardware in the loop
► Power quality analysis
► Source measurement units
► Electron and x-ray microscopy
► Radar level measurement
► Nondestructive test
► Predictive maintenance and structural health