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LM98640CVAL 数据表 (PDF) - Texas Instruments

LM98640CVAL Datasheet PDF - Texas Instruments
部件名 LM98640CVAL
下载  LM98640CVAL 下载
文件大小   642.16 Kbytes
  55 Pages
制造商  TI2 [Texas Instruments]
网页  https://www.ti.com
标志 TI2 - Texas Instruments
功能描述 LM98640QML-SP Radiation Hardness Assured (RHA), Dual Channel, 14-Bit, 40-MSPS Analog Front End With LVDS Output

LM98640CVAL Datasheet (PDF)

Go To PDF Page 下载 数据表
LM98640CVAL Datasheet PDF - Texas Instruments

部件名 LM98640CVAL
下载  LM98640CVAL Click to download

文件大小   642.16 Kbytes
  55 Pages
制造商  TI2 [Texas Instruments]
网页  https://www.ti.com
标志 TI2 - Texas Instruments
功能描述 LM98640QML-SP Radiation Hardness Assured (RHA), Dual Channel, 14-Bit, 40-MSPS Analog Front End With LVDS Output

LM98640CVAL 数据表 (HTML) - Texas Instruments


LM98640CVAL 产品详情

1 Features
1• Radiation Hardened
– TID 100 krad(Si)
– Single Event Latch-Up (SEL) Immune to LET =
120 MeV-cm2/mg
– Single Event Functional Interrupt (SEFI) Free
to 120 MeV-cm2/mg
– SMD 5962R1820301VXC
• ADC Resolution: 14-Bit
• ADC Sampling Rate: 5 MSPS to 40 MSPS
• Input Level: 2.85 V
• Supply Voltages 3.3 V and 1.8 V (Nominal)
– 125 mW per Channel at 15 MSPS
– 178 mW per Channel at 40 MSPS
• CDS or S/H Processing for CCD or CIS Sensors
– CDS or S/H Gain 0 dB or 6 dB
• Programmable Analog Gain for Each Channel
– 256 Steps; Range –3 dB to 18 dB
• Programmable Analog Offset Correction
– Fine and Coarse DAC Resolution ±8 Bits
– Fine DAC Range ±5 mV
– Coarse DAC Range ±250 mV
• Programmable Input Clamp Voltage
• Programmable Sample Edge: 1/64th Pixel Period
• INL at 15 MHz: ±3.5 LSB
• Noise Floor: –79 dB
• Crosstalk: –80 dB
• Operating Temp: –55°C to 125°C

2 Applications
• Space Satellites Scientific Applications
– Focal Plane Electronics
– Imaging Attitude Control Systems
– Earth Imaging

3 Description
The LM98640QML-SP is a fully integrated, high
performance 14-Bit, 5-MSPS to 40-MSPS signal
processing solution. The Serial LVDS output format
performs well during single event exposure,
preventing data loss. The LM98640QML-SP has an
adaptive power scaling feature to optimize power
consumption based on the operating frequency and
amount of gain required. High-speed signal
throughput is achieved with an innovative architecture
utilizing Correlated Double Sampling (CDS), typically
employed with CCD arrays, or Sample and Hold
(S/H) inputs (for CIS and CMOS image sensors). The
sampling edges are programmable to a resolution of
1/64th of a pixel period. Both the CDS and S/H have
a programmable gain of either 0 dB or 6 dB. The
signal paths utilize two ±8-bit offset correction DACs
for coarse and fine offset correction, and 8-bit
Programmable Gain Amplifiers (PGA) that can be
programmed independently for each input. The
signals are then routed to two on chip 14-bit 40-MHz
high performance analog-to-digital converters (ADC).
The fully differential processing channel provides
exceptional noise immunity, having a very low noise
floor of –79 dB at 1x gain.




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