State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
Latch-Up Performance Exceeds 500 mA Per
JESD 17
Typical VOLP (Output Ground Bounce)
< 1 V at VCC = 5 V, TA = 25°C
High-Drive Outputs (−32-mA IOH, 64-mA IOL)
High-Impedance State During Power Up
and Power Down
Parity-Error Flag With Parity
Generator/Checker
Latch for Storage of Parity-Error Flag
Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
DB), and Thin Shrink Small-Outline (PW)
Packages, Ceramic Chip Carriers (FK),
Ceramic Flat (W) Package, and Plastic (NT)
and Ceramic (JT) DIPs

description
The ’ABT853 8-bit to 9-bit parity transceivers are
designed for communication between data buses.
When data is transmitted from the A bus to the
B bus, a parity bit is generated. When data is
transmitted from the B bus to the A bus with its
corresponding parity bit, the open-collector
parity-error (ERR) output indicates whether or not
an error in the B data has occurred. The
output-enable (OEA and OEB) inputs can be used
to disable the device so that the buses are
effectively isolated. The ’ABT853 transceivers
provide true data at their outputs.
A 9-bit parity generator/checker generates a parity-odd (PARITY) output and monitors the parity of the I/O ports
with the ERR flag. The parity-error output can be passed, sampled, stored, or cleared from the latch using the
latch-enable (LE) and clear (CLR) control inputs. When both OEA and OEB are low, data is transferred from
the A bus to the B bus and inverted parity is generated. Inverted parity is a forced error condition that gives the
designer more system diagnostic capability.
When VCC is between 0 and 2.1 V, the device is in the high-impedance state during power up or power down.
However, to ensure the high-impedance state above 2.1 V, OE should be tied to VCC through a pullup resistor;
the minimum value of the resistor is determined by the current-sinking capability of the driver.