Members of the Texas Instruments
SCOPE E Family of Testability Products
Members of the Texas Instruments
WidebusE Family
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
Include D-Type Flip-Flops and Control
Circuitry to Provide Multiplexed
Transmission of Stored and Real-Time Data
Bus Hold on Data Inputs Eliminates the
Need for External Pullup Resistors
B-Port Outputs of ’ABTH182646A Devices
Have Equivalent 25-W Series Resistors, So
No External Resistors Are Required
State-of-the-Art EPIC-IIB E BiCMOS Design
One Boundary-Scan Cell Per I/O
Architecture Improves Scan Efficiency
SCOPE E Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
Packaged in 64-Pin Plastic Thin Quad Flat
(PM) Packages Using 0.5-mm
Center-to-Center Spacings and 68-Pin
Ceramic Quad Flat (HV) Packages Using
25-mil Center-to-Center Spacings