INTRODUCTION
The ST72324 devices are members of the ST7 microcontroller family designed for the 5V operating range.
    – The 32-pin devices are designed for mid-range applications
    – The 42/44-pin devices target the same range of applications requiring more than 24 I/O ports.

■ Memories
    – 8 to 32K dual voltage High Density Flash (HDFlash) with read-out protection capability. InApplication Programming and In-Circuit Programming for HDFlash devices
    – 384 to 1K bytes RAM
    – HDFlash endurance: 100 cycles, data retention: 20 years at 55°C
■ Clock, Reset And Supply Management
    – Enhanced low voltage supervisor (LVD) for main supply with programmable reset thresholds and auxiliary voltage detector (AVD) with interrupt capability
    – Clock sources: crystal/ceramic resonator oscillators, internal RC oscillator, clock security system and bypass for external clock
    – PLL for 2x frequency multiplication
    – Four Power Saving Modes: Halt, Active-Halt, Wait and Slow
■ Interrupt Management
    – Nested interrupt controller
    – 10 interrupt vectors plus TRAP and RESET
    – 9/6 external interrupt lines (on 4 vectors)
■ Up to 32 I/O Ports
    – 32/24 multifunctional bidirectional I/O lines
    – 22/17 alternate function lines
    – 12/10 high sink outputs
■ 4 Timers
    – Main Clock Controller with: Real time base, Beep and Clock-out capabilities
    – Configurable watchdog timer
    – 16-bit Timer A with: 1 input capture, 1 output compare, external clock input, PWM and pulse generator modes
    – 16-bit Timer B with: 2 input captures, 2 output compares, PWM and pulse generator modes
■ 2 Communication Interfaces
    – SPI synchronous serial interface
    – SCI asynchronous serial interface
■ 1 Analog Peripheral (low current coupling)
    – 10-bit ADC with up to 12 robust input ports
■ Instruction Set
    – 8-bit Data Manipulation
    – 63 Basic Instructions
    – 17 main Addressing Modes
    – 8 x 8 Unsigned Multiply Instruction
■ Development Tools
    – Full hardware/software development package
    – In-Circuit Testing capability