GENERAL DESCRIPTION
The AD9154 is a quad, 16-bit, high dynamic range digital-to-analog converter (DAC) that provides a maximum sample rate of 2.4 GSPS, permitting multicarrier generation up to the Nyquist frequency in baseband mode. The AD9154 includes features optimized for direct conversion transmit applications, including complex digital modulation, input signal power detection, and gain, phase, and offset compensation. The DAC outputs are optimized to interface seamlessly with the ADRF6720-27 radio frequency quadrature modulator (AQM) from Analog Devices, Inc. In mix mode, the AD9154 DAC can reconstruct carriers in the second and third Nyquist zones. A serial port interface (SPI) provides the programming/readback of internal parameters.
The full-scale output current can be programmed over a range of 4 mA to 20 mA. The AD9154 is available in two different 88-lead LFCSP packages.

FEATURES
   Supports input data rates up to 1.096 GSPS
   Proprietary, low spurious and distortion design
      Single carrier LTE 20 MHz bandwidth (BW), ACLR = 77 dBc at
         180 MHz IF
      Six carrier GSM IMD = 78 dBc, 600 kHz carrier spacing at
         180 MHz IF
      SFDR = 72 dBc at 180 MHz IF, −6 dBFS single tone
   Flexible 8-lane JESD204B interface
   Multiple chip synchronization
      Fixed latency
      Data generator latency compensation
   Input signal power detection
   High performance, low noise phase-locked loop (PLL) clock
      multiplier
   Digital inverse sinc filter
   Digital quadrature modulation using a numerically
      controlled oscillator (NCO)
   Nyquist band selection—mix mode
   Selectable 1×, 2×, 4×, and 8× interpolation filters
   Low power: 2.11 W at 1.6 GSPS, full operating conditions
   88-lead, exposed pad LFCSP

APPLICATIONS
   Wireless communications
      Multicarrier LTE and GSM base stations
      Wideband repeaters
      Software defined radios
   Wideband communications
      Point to point microwave radio
   Transmit diversity, multiple input/multiple output (MIMO)
   Instrumentation
   Automated test equipment