| 制造商 | 部件名 | 数据表 | 功能描述 |
 Aries Electronics, Inc. |
24-6556-10
|
705Kb / 2P |
Universal Test Socket Receptacle
|
|
84-537-21
|
1Mb / 2P |
?쁋ive Bug??Type Universal PLCC ZIF Test Socket
|
|
20-537-20
|
491Kb / 1P |
Insert Plates for Universal PLCC ZIF Test Socket
|
|
44-547-11
|
733Kb / 1P |
Universal SOIC ZIF (Zero-Insertion-Force) Test Socket
|
|
10002
|
716Kb / 1P |
High-Temp Universal ZIF DIP Burn-in & Test Socket
|
|
10003
|
829Kb / 2P |
Universal Test Socket Receptacle
|
|
10010
|
1Mb / 2P |
Universal PLCC ZIF Test Socket
|
|
10012
|
529Kb / 1P |
Universal PLCC ZIF Test Socket
|
|
10004HT
|
1Mb / 2P |
High-Temp PGA ZIF Test & Burn-in Socket for Footprints on Std 8x8 to 21x21 Grid
|
|
24001HT
|
533Kb / 1P |
High-Temp up to 250째C RF Test Socket with Replaceable Contact Strips
|