| 制造商 | 部件名 | 数据表 | 功能描述 |
 Texas Instruments |
SN54LVT18502
|
405Kb / 29P |
3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
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SN54LVT18512
|
588Kb / 36P |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
|
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SN54LVTH18502A
|
613Kb / 38P |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
|
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SN54LVTH18512
|
562Kb / 36P |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
|
|
SN54LVTH18512
|
703Kb / 38P |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
|
|
SN54LVTH18502A
|
784Kb / 40P |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
|
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SN74LVT182502
|
509Kb / 36P |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
|
|
SN74LVTH18502A-EP
|
935Kb / 42P |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
|
|
SN74LVT18504
|
456Kb / 32P |
3.3-V ABT SCAN TEST DEVICE WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
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SN74LVTH18512-EP
|
684Kb / 38P |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
|