| 制造商 | 部件名 | 数据表 | 功能描述 |
 Sanyo Semicon Device |
LC75281E
|
176Kb / 10P |
Parametric Equalizer System
|
|
LV3100M
|
425Kb / 9P |
Parametric Equalizer
|
 Samsung semiconductor |
K9F1208U0C
|
685Kb / 38P |
FLASH MEMORY
|
 Agilent(Hewlett-Packard... |
N9201A
|
115Kb / 4P |
Array Structure Parametric Test Option
|
 ATMEL Corporation |
AT89C51
|
148Kb / 17P |
4K Bytes of In-System Reprogrammable Flash Memory
|
|
AT89C52
|
204Kb / 24P |
8K Bytes of In-System Reprogrammable Flash Memory
|
 Keysight Technologies |
U2941A
|
1Mb / 6P |
Parametric Test Fixture
|
|
E6708A
|
98Kb / 4P |
RF Parametric and Functional Test
|
|
4082A
|
297Kb / 21P |
Parametric Test System
|
 ATMEL Corporation |
ATTINY102
|
411Kb / 2P |
1KB in-system programmable Flash memory
|