| 制造商 | 部件名 | 数据表 | 功能描述 |
 Dallas Semiconductor |
DS21372
|
214Kb / 21P |
3.3V Bit Error Rate Tester BERT
|
|
DS2172
|
213Kb / 21P |
Bit Error Rate Tester BERT
|
 fujitsu semiconductor |
MB1426
|
734Kb / 15P |
16 BIT ERROR CHECKING & CORRECTION
|
 Agilent(Hewlett-Packard... |
N2101B
|
255Kb / 4P |
Bit Error Ratio Tester
|
 Texas Instruments |
TLC5540
|
879Kb / 24P |
8-Bit Resolution Differential Linearity Error Integral Linearity Error
|
 Union Semiconductor, In... |
UM488
|
363Kb / 17P |
Enhanced Slew-Rate Limiting Facilitates Error-Free Data Transmission
|
 TEKTRONIX, INC. |
BSX
|
1Mb / 38P |
Bit Error Rate Tester
|
 Maxim Integrated Produc... |
MAX17135EVKIT
|
2Mb / 12P |
Measures Remote Diode Temperature
Rev 1; 1/12 |
|
DS2172
|
180Kb / 22P |
Bit Error Rate Tester (BERT)
101000 |
|
DS21372
|
180Kb / 22P |
3.3V Bit Error Rate Tester (BERT)
101000 |