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TPS73030DBVT 数据表(PDF) 2 Page - Texas Instruments

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部件名 TPS73030DBVT
功能描述  LOW-NOISE, HIGH PSRR, RF 200-mA LOW-DROPOUT LINEAR REGULATORS
PDF  13 Pages
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制造商  TI [Texas Instruments]
网页  http://www.ti.com
标志 TI - Texas Instruments

TPS73030DBVT 数据表(HTML) 2 Page - Texas Instruments

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ABSOLUTE MAXIMUM RATINGS
TPS73001, TPS73018
TPS73025
TPS73030, TPS73033
SBVS054A – NOVEMBER 2004 – REVISED NOVEMBER 2004
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
AVAILABLE OPTIONS(1)(2)
PRODUCT
VOLTAGE
PACKAGE
TJ
SYMBOL
PART NUMBER
TPS73001
1.22 V to 5.5 V
SOT23 (DBV)
PGVI
TPS73001DBVR
TPS73018
1.8 V
SOT23 (DBV)
PHHI
TPS73018DBVR
TPS73025
2.5 V
SOT23 (DBV)
-40
°C to +125°C
PGWI
TPS73025DBVR
TPS73030
3 V
SOT23 (DBV)
PGYI
TPS73030DBVR
TPS73033
3.3 V
SOT23 (DBV)
PHUI
TPS73033DBVR
(1)
For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet.
(2)
DBVR indicates tape and reel of 3000 parts.
over operating temperature range (unless otherwise noted)(1)
UNIT
VIN range
-0.3 V to 6 V
VEN range
-0.3 V to VIN + 0.3 V
VOUT range
-0.3 V to 6 V
Peak output current
Internally limited
ESD rating, HBM
2 kV
ESD rating, CDM
500 V
Continuous total power dissipation
See Dissipation Ratings Table
Junction temperature range
-40
°C to 150°C
Storage temperature range, Tstg
-65
°C to 150°C
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2



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