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DS90CF582 数据表(PDF) 6 Page - National Semiconductor (TI) |
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DS90CF582 数据表(HTML) 6 Page - National Semiconductor (TI) |
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6 / 12 page ![]() AC Timing Diagrams TLF12486 – 15 FIGURE 1 ‘‘WORST CASE’’ Test Pattern TLF12486 – 16 FIGURE 2 ‘‘16 GRAYSCALE’’ Test Pattern Note 1 The worst case test pattern produces a maximum toggling of digital circuits LVDS IO and CMOSTTL IO Note 2 The 16 grayscale test pattern tests device power consumption for a ‘‘typical’’ LCD display pattern The test pattern approximates signal switching needed to produce groups of 16 vertical stripes across the display Note 3 Figure 1 and Figure 2 show a falling edge data strobe (TxCLK INRxCLK OUT) http www nationalcom 6 |
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