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MB39C014 数据表(PDF) 13 Page - Cypress Semiconductor |
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MB39C014 数据表(HTML) 13 Page - Cypress Semiconductor |
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13 / 32 page ![]() Document Number: 002-08361 Rev. *C Page 13 of 32 MB39C014 9. Test Circuit for Measuring Typical Operating Characteristics Note : These components are recommended based on the operating tests authorized. TDK : TDK Corporation SSM : SUSUMU Co., Ltd KOA : KOA Corporation Component Specification Vendor Part Number Remark R1 1 MΩ KOA RK73G1JTTD D 1 MΩ R3-1 R3-2 7.5 kΩ 120 kΩ SSM SSM RR0816-752-D RR0816-124-D At VOUT = 2.5 V setting R4 300 kΩ SSM RR0816-304-D R5 1 MΩ KOA RK73G1JTTD D 1 MΩ C1 4.7 µF TDK C2012JB1A475K C2 4.7 µF TDK C2012JB1A475K C6 0.1 µF TDK C1608JB1H104K For adjusting slow start time L1 2.2 µH TDK VLF4012AT-2R2M 2.0 MHz operation 1.5 µH TDK VLF4012AT-1R5M 3.2 MHz operation VIN VOUT L1 C1 IOUT C2 SW CTL MODE VREF VREFIN GND OUT LX VDD GND R5 VDD VDD MB39C014 POWER GOOD FSEL R1 R4 R3-1 R3-2 SW SW C6 10 3 8 4 6 7 1 9 5 2 Output voltage = VREFIN × 2.97 |
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