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ADL5604ACPZ-R7 数据表(PDF) 19 Page - Analog Devices

部件名 ADL5604ACPZ-R7
功能描述  RF Driver Amplifier
PDF  23 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADL5604ACPZ-R7 数据表(HTML) 19 Page - Analog Devices

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Data Sheet
ADL5604
Rev. C | Page 19 of 23
ACPR AND EVM
All adjacent channel power ratio (ACPR) and error vector
magnitude (EVM) measurements were made using a single
W-CDMA carrier and Test Model 1-64.
The signal is generated by a very low ACPR source and is
measured at the output by a high dynamic range spectrum
analyzer. For ACPR measurements, the filter setting was chosen
for low ACPR and for EVM measurements the low EVM setting
was selected. The baseline composite EVM for the signal source
used was around 0.5%. Highly linear amplifiers were used to
measure ACPR and EVM at higher output power levels.
Figure 26 shows the plot of ACPR vs. POUT at 946 MHz. Shown
on the same plot is the system ACPR. For power levels up to
11 dBm, an ACPR of 65 dBc or better can be achieved.
Figure 27 shows the ACPR vs. POUT at 1966 MHz. Shown on
the same plot is the system ACPR. For power levels up to 11 dBm,
an ACPR of 65 dBc or better can be achieved.
Figure 28 shows ACPR vs. POUT at 2140 MHz. Shown on the
same plot is the system ACPR. For power levels up to 12 dBm,
an ACPR of 65 dBc or better can be achieved. Figure 29 shows
the plot of EVM vs. POUT at 946 MHz. The EVM measured is
less than 1% for power levels up to 15 dBm.
Figure 30 shows the EVM vs. POUT at 1966 MHz. The EVM
measured is less than 1% for power levels up to 18 dBm.
Figure 31 shows the EVM vs. POUT at 2140 MHz. The EVM
measured is less than 1% for power levels up to 18 dBm.
When operated in the linear region, there is little or no
contribution to EVM by the amplifier.
THERMAL CONSIDERATIONS
The ADL5604 is packaged in a thermally efficient 4 mm × 4 mm,
16-lead LFCSP. The thermal resistance from junction to air (θJA)
is 32.1oC/W. The thermal resistance for the product was extracted
assuming a standard 4-layer JEDEC board with nine copper
filled thermal vias. The thermal resistance from junction to case
JC) is 6°C/W where case is the exposed pad of the lead frame
package.
For the best thermal performance, it is recommended to add as
many thermal vias as possible under the exposed pad of the
LFCSP. The above thermal resistance numbers assume a
minimum of nine thermal vias arranged in a 3 × 3 array with a
diameter of 8 mils and a pitch of 16 mils. Because the top and
bottom leads of the package are ground, the ground pattern on
the evaluation board is extended on the top and bottom to
improve thermal efficiency (see the Evaluation Board section).
SOLDERING INFORMATION AND RECOMMENDED
PCB LAND PATTERN
Figure 43 shows the recommended land pattern for the ADL5604.
To minimize thermal impedance, the exposed paddle on the
4 mm × 4 mm LFCSP package is soldered down to a ground
plane along with Pin 5 to Pin 8 and Pin 13 to Pin 16. To improve
thermal dissipation, nine thermal vias are arranged in a 3 × 3
array under the exposed paddle. Areas above and below the
paddle are tied with regular vias. If multiple ground layers exist,
they should be tied together using vias. For more information on
land pattern design and layout, see the AN-772 Application
Note, A Design and Manufacturing Guide for the Lead Frame
Chip Scale Package (LFCSP).
5
8
13
16
RFIN
RFOUT
THERMAL VIAS
8 MIL
FILLED VIAs
16 MIL
FILLED VIAs
Figure 43. Recommended Land Pattern



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