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ISL5861/2IAZ 数据表(PDF) 9 Page - Renesas Technology Corp

部件名 ISL5861/2IAZ
功能描述  12-bit, 3.3V, 130/210MSPS, High Speed D/A Converter
PDF  14 Pages
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制造商  RENESAS [Renesas Technology Corp]
网页  http://www.renesas.com
标志 RENESAS - Renesas Technology Corp

ISL5861/2IAZ 数据表(HTML) 9 Page - Renesas Technology Corp

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ISL5861
FN6008 Rev 3.00
Page 9 of 14
Oct 7, 2015
Definition of Specifications
Adjacent Channel Power Ratio, ACPR, is the ratio of the
average power in the adjacent frequency channel (or offset) to
the average power in the transmitted frequency channel.
Differential Linearity Error, DNL, is the measure of the step
size output deviation from code to code. Ideally the step size
should be 1 LSB. A DNL specification of 1 LSB or less
guarantees monotonicity.
EDGE, Enhanced Data for Global Evolution, a TDMA
standard for cellular applications which uses 200kHz BW, 8-
PSK modulated carriers.
Full Scale Gain Drift, is measured by setting the data inputs to
be all logic high (all 1s) and measuring the output voltage
through a known resistance as the temperature is varied from
TMIN to TMAX. It is defined as the maximum deviation from the
value
measured at room temperature to the value measured at
either TMIN or TMAX. The units are ppm of FSR (full scale
range) per oC.
Full Scale Gain Error, is the error from an ideal ratio of 32
between the output current and the full scale adjust current
(through RSET).
GSM, Global System for Mobile Communication, a TDMA
standard for cellular applications which uses 200kHz BW,
GMSK modulated carriers.
Integral Linearity Error, INL, is the measure of the worst case
point that deviates from a best fit straight line of data values
along the transfer curve.
Internal Reference Voltage Drift, is defined as the maximum
deviation
from the value measured at room temperature to the
value
measured at either TMIN or TMAX. The units are ppm per
oC.
Offset Drift, is measured by setting the data inputs to all logic
low (all 0s) and measuring the output voltage at IOUTA through
a known resistance as the temperature is varied from TMIN to
TMAX. It is defined as the maximum deviation from the value
measured at room temperature to the value measured at either
TMIN or TMAX. The units are ppm of FSR (full scale range) per
degree oC.
Offset Error, is measured by setting the data inputs to all logic
low (all 0s) and measuring the output voltage of IOUTA through
a known resistance. Offset error is defined as the maximum
deviation
of the IOUTA output current from a value of 0mA.
Output Voltage Compliance Range, is the voltage limit
imposed on the output. The output impedance should be
chosen such that the voltage developed does not violate the
compliance range.
Power Supply Rejection, is measured using a single power
supply. The nominal supply voltage is varied 10% and the
change in the DAC full scale output is noted.
Reference Input Multiplying Bandwidth, is defined as the
3dB bandwidth of the voltage reference input. It is measured
by using a sinusoidal waveform as the external reference with
the digital inputs set to all 1s. The frequency is increased until
the amplitude of the output waveform is 0.707 (-3dB) of its
original value.
Spurious Free Dynamic Range, SFDR, is the amplitude
difference from the fundamental signal to the largest
harmonically or non-harmonically related spur within the
specified frequency window.
Total Harmonic Distortion, THD, is the ratio of the RMS value
of the fundamental output signal to the RMS sum of the first
five harmonic components.
UMTS, Universal Mobile Telecommunications System, a
W-CDMA standard for cellular applications which uses
3.84MHz modulated carriers.
Detailed Description
The ISL5861 is a 12-bit, current out, CMOS, digital to analog
converter. The maximum update rate is at least 210+MSPS
and can be powered by a single power supply in the
recommended range of +3.0V to +3.6V. Operation with clock
rates higher than 210MSPS is possible; please contact the
factory for more information. It consumes less than 120mW of
power when using a +3.3V supply, the maximum 20mA of
output current, and the data switching at 210MSPS. The
architecture is based on a segmented current source
arrangement that reduces glitch by reducing the amount of
current switching at any one time. In previous architectures
that contained all binary weighted current sources or a binary
weighted resistor ladder, the converter might have a
substantially larger amount of current turning on and off at
certain, worst-case transition points such as midscale and
quarter scale transitions. By greatly reducing the amount of
current switching at these major transitions, the overall glitch of
the converter is dramatically reduced, improving settling time,
transient problems, and accuracy.
Digital Inputs and Termination
The ISL5861 digital inputs are guaranteed to 3V LVCMOS
levels. The internal register is updated on the rising edge of the
clock. To minimize reflections, proper termination should be
implemented. If the lines driving the clock and the digital inputs
are long 50
 lines, then 50 termination resistors should be
placed as close to the converter inputs as possible connected
to the digital ground plane (if separate grounds are used).
These termination resistors are not likely needed as long as
the digital waveform source is within a few inches of the DAC.
For pattern drivers with very high speed edge rates, it is
recommended that the user consider series termination (50-
200
prior to the DAC’s inputs in order to reduce the amount
of noise.



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