AD8494CRMZ-R7 datasheet(4/16 Pages) AD

4 / 16 page

AD8494/AD8495/AD8496/AD8497

Data Sheet

Rev. D | Page 4 of 16

A Grade

C Grade

Parameter

Test Conditions/Comments

Min

Typ

Max

Min

Typ

Max

Unit

TEMPERATURE RANGE (TA)

Specified Performance

AD8494/AD8495

°C

AD8496/AD8497

100

°C

Operational

−40

+125

−40

+125

°C

1 Ambient temperature rejection specifies the change in the output measurement (in °C) for a given change in temperature of the cold junction. For the AD8494 and

AD8495, ambient temperature rejection is defined as the slope of the line connecting errors calculated at 0°C and 50°C ambient temperature. For the AD8496 and

AD8497, ambient temperature rejection is defined as the slope of the line connecting errors calculated at 25°C and 100°C ambient temperature.

2 Error does not include thermocouple gain error or thermocouple nonlinearity.

3 With a 100 kΩ load, measurement junction temperatures beyond approximately 880°C for the AD8494 and AD8496 and beyond approximately 960°C for the AD8495

and AD8497 require supply voltages larger than 5 V or a negative voltage applied to the reference pin. Measurement junction temperatures below 5°C require either a

positive offset voltage applied to the reference pin or a negative supply.

4 Input stage uses PNP transistors, so bias current always flows out of the part.

5 Large output currents can increase the internal temperature rise of the part and contribute to cold junction compensation (CJC) error.

6 Unbalanced supplies can also be used. Care should be taken that the common-mode voltage of the thermocouple stays within the input voltage range of the part.

AD8494CRMZ-R7 数据表(PDF) 4 Page - Analog Devices

AD8494CRMZ-R7 数据表(HTML) 4 Page - Analog Devices

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16

数据表下载