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A3I35D025WN 数据表(PDF) 8 Page - NXP Semiconductors

部件名 A3I35D025WN
功能描述  RF LDMOS Wideband Integrated Power Amplifiers
PDF  18 Pages
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制造商  NXP [NXP Semiconductors]
网页  http://www.nxp.com
标志 NXP - NXP Semiconductors

A3I35D025WN 数据表(HTML) 8 Page - NXP Semiconductors

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RF Device Data
NXP Semiconductors
A3I35D025WNR1 A3I35D025WGNR1
Table 10. Load Pull Performance — Maximum Efficiency Tuning
VDD =28 Vdc, IDQ1(A) =36 mA, IDQ2(A) = 130 mA, Pulsed CW, 10 sec(on), 10% Duty Cycle
f
(MHz)
Zsource
()
Zin
()
Max Drain Efficiency
P1dB
Zload (1)
()
Gain (dB)
(dBm)
(W)
D
(%)
AM/PM
()
3200
78.0 – j14.9
89.3 + j9.63
31.4 – j22.6
28.9
41.2
13
55.7
–9
3400
60.6 + j14.4
64.5 – j22.5
26.7 – j8.05
29.3
41.1
13
56.4
–6
3600
47.3 + j7.35
57.7 – j16.2
15.1 – j6.90
28.7
41.0
12
59.2
–8
3800
37.2 – j9.77
48.5 + j0.17
12.3 – j11.0
27.5
41.6
15
58.1
–7
4000
27.5 – j10.3
40.6 + j2.95
9.72 – j12.6
26.8
41.7
15
56.2
–9
f
(MHz)
Zsource
()
Zin
()
Max Drain Efficiency
P3dB
Zload (2)
()
Gain (dB)
(dBm)
(W)
D
(%)
AM/PM
()
3200
78.0 – j14.9
88.3 + j6.72
32.6 – j22.0
27.0
42.0
16
57.7
–14
3400
60.6 + j14.4
62.8 – j22.2
27.2 – j7.61
27.4
41.8
15
58.1
–9
3600
47.3 + j7.35
53.9 – j12.9
17.0 – j9.75
26.5
42.3
17
60.5
–8
3800
37.2 – j9.77
45.7 + j1.91
11.8 – j11.6
25.4
42.4
17
57.8
–7
4000
27.5 – j10.3
37.1 + j7.45
11.0–j13.2
24.7
42.5
18
55.1
–12
(1) Load impedance for optimum P1dB efficiency.
(2) Load impedance for optimum P3dB efficiency.
Zsource = Measured impedance presented to the input of the device at the package reference plane.
Zin
= Impedance as measured from gate contact to ground.
Zload = Measured impedance presented to the output of the device at the package reference plane.
Note: Measurement made on a per side basis.
Input Load Pull
Tuner and Test
Circuit
Device
Under
Test
Zsource Zin
Zload
Output Load Pull
Tuner and Test
Circuit



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