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ML2201 数据表(PDF) 9 Page - OKI electronic componets |
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ML2201 数据表(HTML) 9 Page - OKI electronic componets |
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9 / 20 page ![]() FEDL2201-01 1Semiconductor ML2201–XXX 9/20 FUNCTIONAL DESCRIPTION Sampling Frequency You can select a sampling frequency for each phrase address from the following list while you are working on sound data. Select a sampling frequency that satisfies f SAM = 3.9 to 28.0 kHz from the values obtained with the dividing factors as shown in the Table 1 below. Table 1 Sampling Frequency Sampling Frequency At f EXTCLK = 4.096 MHz Dividing Factor 4.0 kHz f EXTCLK/1024 5.3 kHz f EXTCLK/768 6.4 kHz f EXTCLK/640 8.0 kHz f EXTCLK/512 10.6 kHz f EXTCLK/384 12.8 kHz f EXTCLK/320 16.0 kHz f EXTCLK/256 Memory Allocation and Playback Time Length As shown in the Figure 1, the on-chip Mask ROM of ML2201 is partitioned into four areas, Phrase Control Table, Address Control Table, Test Data area and User’s Data area. The actual data area where user’s sound data can be stored is 378 Kbit, that is the total on-chip Mask ROM capacity minus 6 Kbit. Phrase Control Table Area Address Control Table Area Test Data Area User’s Sound Data Area 2 Kbit 2 Kbit 2 Kbit 378 Kbit Figure 1 On-chip Mask ROM (384 Kbit) Memory Allocation |
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