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M8888-R1 数据表(PDF) 8 Page - Clare, Inc. |
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M8888-R1 数据表(HTML) 8 Page - Clare, Inc. |
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8 / 14 page ![]() DC Characteristics Parameter Symbol Min Typ* Max Units Operating supply voltage V DD 4.75 5.0 5.25 V Operating supply current I DD -10 15 mA Power consumption P O - 50 78.75 mW Inputs High-level input voltage, OSC1 V IHO 3.5 - - V Low-level input voltage, OSC1 V ILO - - 1.5 V Input impedance (@ 1 KHz), IN+, IN- R IN -10 - M Ω Steering threshold voltage V TSt 2.2 2.3 2.5 V Outputs High-level output voltage (no load), OSC2 V OHO V DD - 0.1V - - V Low-level output voltage (no load), OSC2 V OLO - - 0.1 V Output leakage current (V OH = 2.4V), IRQ I OZ - 1.0 10.0 µA V REF output voltage (no load) V REF 2.4 - 2.7 V V REF output resistance R OR - - 1.0 k Ω Data Bus Low-level input voltage V IL - - 0.8 V High-level input voltage V IH 2.0 - - V Low-level output voltage (I OL = 1.6 mA) V OL - - 0.4 V High-level output voltage (I OH = 400 µA) V OH 2.4 - - V Input leakage current (V IN = 0.4 to 2.4 V) I IZ - - 10.0 µA All voltages referenced to V SS unless otherwise noted. VDD = 5.0 V ± 5%; fC = 3.579545 MHz; TA = -40°C to +85°C unless otherwise noted. *Typical values are for use as design aids only, and are not guaranteed or subject to production testing. Parameter Symbol Value Power supply voltage (V DD - VSS)VDD + 6.0 V max Voltage on any pin V dc V SS -0.3 V to VDD + 0.3V Current on any pin I DD 10 mA max Operating temperature T A -40°C to +85°C Storage temperature T S -65°C to +150°C Note: Exceeding these ratings may cause permanent damage. Functional operation under these conditions is not implied. www.clare.com 8 M-8888 Rev. 1 Absolute Maximum Ratings Absolute Maximum Ratings are stress ratings. Stresses in excess of these ratings can cause permanent damage to the device. Functional operation of the device at these or any other conditions beyond those indicated in the opera- tional sections of this data sheet is not implied. Exposure of the device to the absolute maximum ratings for an extend- ed period may degrade the device and effect its reliability. |
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