数据搜索系统,热门电子元器件搜索
  Chinese  ▼
ALLDATASHEETCN.COM

X  

ST486DX2 数据表(PDF) 4 Page - STMicroelectronics

部件名 ST486DX2
功能描述  ST 486 DX ASIC CORE
PDF  8 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

ST486DX2 数据表(HTML) 4 Page - STMicroelectronics

  ST486DX2 Datasheet HTML 1Page - STMicroelectronics ST486DX2 Datasheet HTML 2Page - STMicroelectronics ST486DX2 Datasheet HTML 3Page - STMicroelectronics ST486DX2 Datasheet HTML 4Page - STMicroelectronics ST486DX2 Datasheet HTML 5Page - STMicroelectronics ST486DX2 Datasheet HTML 6Page - STMicroelectronics ST486DX2 Datasheet HTML 7Page - STMicroelectronics ST486DX2 Datasheet HTML 8Page - STMicroelectronics  
Zoom Inzoom in Zoom Outzoom out
 4 / 8 page
background image
ST 486 DX ASIC CORE
4/8
®
Examples include mixed mode cells for graphics,
DAC/ADC’s (4-9 bit), PLL applications, and Digital
Signal Processor functions for cellular comms, fax
and
high-speed
modem.
100
Mbps
serial
transputer links coupled with large and fast
memory can be used for pipelining, caching and
synchro
circuits in
modern
CISC
computing
architecture.
Viterbi and Reed Solomon cores aim at the HDTV
and satellite transmission markets. To support
telecom needs for CCITT standard applications,
ADPCM cells supporting CT2 protocol have been
developed. MPEG2 decoders interfacing directly
to the system memory are ideal for settop and
cable applications.
DESIGN FOR TESTABILITY
Using the internal test modes of the 486 core,
accessed through special test logic, the core
module can be thoroughly tested in ‘stand alone’
mode at both wafer sort and packaged die test.
The
HCMOS
6
library
supports
the
JTAG
boundary Scan and both edge and level sensitive
scan
design
techniques
by
providing
the
necessary macrocells. Scan testing aids device
testability by permitting access to internal nodes
without requiring a separate external connection
for each node accessed. Testability is assured at
device level with the close coupling of LSSD latch
elements, Automatic Test Pattern Generation
(ATPG) and high pattern depth tester architecture.
At system level, SGS-THOMSON fully supports
IEEE 1149.1. Several types of core scan cells are
provided in the HCMOS 6 library.
PACKAGE AVAILABILITY
The HCMOS 6 library is designed to be compatible
with QFP and BGA package types, in addition to
the more traditional types of package.
The options include Quad Flat Pack (xQFP)
offering ranges up to 304 pins.
Both high
performance and high power variants are available
as well as the TQFP thin types.
Ball Grid Array (BGA) packages are available from
160 to 500 pins.
Pin counts for through board mounting range up to
299. For higher pin counts the range is compatible
with the industry standard JEDEC and EIA-J
Guardring Quad Flatpack (GQPF) with pin counts
from 186 to 304.
The diversity in pin count and package style gives
the designer the opportunity to find the best
compromise
for
system
size,
cost
and
performance requirements.
DESIGN ENVIRONMENT
Several interface levels are possible between
SGS-THOMSON
and
the
customer
in
the
undertaking of a 486 Core design. The four levels
of interface are shown in Figure 3. Level 1 is
characterized by SGS-THOMSON receiving the
system specification and taking the design through
to validation and fabrication. At level 2 interface
the designer supplies a simulated netlist at the
RTL HDL level. SGS-THOMSON then takes the
design through synthesis and gate level simulation
to layout, validation and fabrication.
Level 3 the designer completes the design to final
gate level simulation. The design is then taken
through layout, validation and fabrication by SGS-
THOMSON.
At level 4 the designer completes all of the design
and layout and supplies the design database to
SGS-THOMSON
in
GDS
2
format.
SGS-
THOMSON will then complete LVS and DRC and
generate the PG tape for mask generation and
fabrication.
TECHNOLOGY
For this product, a high performance, low voltage,
five level metal, salicided poly and diffusion
HCMOS 0.35 micron process has been used to
achieve sub-nanosecond internal speeds while
offering very low power dissipation and high noise
immunity.
Its fabrication involve more than 140 elementary
operations,
including
selective
tungsten vias,
plasma interment dielectric deposition and CMP
(Chemical-Mechanical
Planarization)
for
the
incrementally oxides.
METHODOLOGY
The
design
environment
for
x86
embedded
products
has
been
designed
for
maximum
flexibility and reliability, and has been based on
typical ASIC like design flows using HDL and
Synthesis methodologies.



Html Pages

1 2 3 4 5 6 7 8


数据表 下载

Go To PDF Page


链接网址



ALLDATASHEET是否为您带来帮助?  [ DONATE ] 

关于 Alldatasheet   |   广告服务   |   联系我们   |   隐私政策   |   数据表链接    |   链接交换   |   制造商名单
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com