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SWG7002K 数据表(PDF) 2 Page - SeCoS Halbleitertechnologie GmbH |
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SWG7002K 数据表(HTML) 2 Page - SeCoS Halbleitertechnologie GmbH |
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2 / 4 page ![]() Elektronische Bauelemente SWG7002K 0.38A, 60V, RDS(O ) 1.8 Ω Ω Ω Ω -Channel Enhancement MOSFET 26-Sep-2017 Rev. A Page 2 of 4 http://www.SeCoSGmbH.com/ Any changes of specification will not be informed individually. ELECTRICAL CHARACTERISTICS (T J=25°C unless otherwise specified) Parameter Symbol Min. Typ. Max. Unit Test Condition Drain-Source Breakdown Voltage V(BR)DSS 60 - - V VGS=0V, ID=250µA Drain-Source Breakdown Voltage Temperature Coefficient V(BR)DSS/TJ - 71 - mV/°C - - 1 VDS=60V, VGS=0, TJ=25°C - - 500 µA VDS=60V, VGS=0, TJ=125°C Zero Gate Voltage Drain Current IDSS - - 100 nA VDS=50V, VGS=0, TJ=25°C Gate-Source Leakage Current IGSS - - ±10 µA VDS=0V, VGS=±20V Gate Threshold Voltage 2 VGS(th) 1 - 2.5 V VDS=VGS, ID=250µA Negative Threshold Temperature Coefficient 2 VGS(th)/TJ - 4 - mV/°C - - 1.8 VGS=10V, ID=500mA Drain-Source On-Resistance 2 RDS(ON) - - 2.5 VGS=5V, ID=50mA Forward Transfer conductance 2 gfs - 80 - S VDS=5V, ID=200mA Total Gate Charge Qg(tot) - 0.7 - Threshold Gate Charge Qg(th) - 0.1 - Gate-Source Charge Qgs - 0.3 - Gate-Drain Charge Qgd - 0.1 - nC VGS=4.5V VDS=10V ID=200mA Turn-On Delay Time 3 Td(on) - 9.9 - Rise Time 3 Tr - 5 - Turn-Off Delay Time 3 Td(off) - 39.4 - Fall Time 3 Tf - 17.9 - nS VDD=10V VGS=10V ID=500mA Input Capacitance Ciss - 32.8 - Output Capacitance Coss - 5.4 - Reverse Transfer Capacitance Crss - 2.9 - pF VDS=25V VGS=0V f=1MHz Drain-Source Diode - - 1.4 VGS=0V, IS=115mA, TJ=25°C Forward Diode Voltage VSD - 0.7 - V VGS=0V, IS=115mA, TJ=85°C Notes: 1. Surface−mounted on FR4 board using 1 in sq pad size (Cu area = 1.127 in sq [1 oz] including traces). 2. Pulse Test: pulse width=300µs, duty cycle≦2%. 3. Switching characteristics are independent of operating junction temperature. |
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