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ULN2012L-S16-R 数据表(PDF) 5 Page - Unisonic Technologies |
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ULN2012L-S16-R 数据表(HTML) 5 Page - Unisonic Technologies |
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5 / 6 page ![]() ULN2012 Preliminary LINEAR INTEGRATED CIRCUIT UNISONICTECHNOLOGIESCO.,LTD 5 of 6 www.unisonic.com.tw QW-R113-020.a TEST CIRCUIT Components in the test circuits are used only to obtain and confirm the device characteristics. These components and circuits are not guaranteed to prevent malfunction or failure from occurring in the application equipment. VIN OPEN VCE ICEX µA Figure 1 OPEN hFE=IC/IB IC VCE IB V Figure 2 IIN OPEN mA OPEN VIN Figure 3 IIN OPEN VCE IC µA µA Figure 4 OPEN IC VCE V V VIN Figure 5 OPEN IR µA Figure 6 OPEN IF V VF Figure 7 |
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