 |
数据搜索系统，热门电子元器件搜索 |
|
|
数据搜索系统，热门电子元器件搜索 |
|
BQ27Z561-R1 数据表(PDF) 5 Page - Texas Instruments |
|
|
|
|||||||||||||||||||||||||||||
BQ27Z561-R1 数据表(HTML) 5 Page - Texas Instruments |
|
|
5 / 26 page  5 BQ27Z561-R1 www.ti.com SLUSDH5 – MARCH 2019 Product Folder Links: BQ27Z561-R1 Submit Documentation Feedback Copyright © 2019, Texas Instruments Incorporated 7.5 Supply Current Unless otherwise noted, characteristics noted under conditions of TA = –40 to 85℃ PARAMETER TEST CONDITIONS MIN TYP MAX UNIT INORMAL Standard operating Conditions 60 µA ISLEEP Sense resistor current below Sleep mode threshold 11 µA IDEEPSLEEP Sense resistor current below Deep Sleep mode threshold 9 µA IOFF CE = VIL 0.5 µA 7.6 Internal 1.8-V LDO (REG18) Unless otherwise noted, characteristics noted under conditions of TA = –40 to 85℃ PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VREG18 Regulator output voltage 1.6 1.8 2.0 V VPORth POR threshold Rising Threshold 1.45 1.7 V VPORhy POR hysteresis 0.1 V 7.7 I/O (CE, PULS, INT) Unless otherwise noted, characteristics noted under conditions of TA = –40 to 85℃ PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIH High-level input voltage VREG18 = 1.8 V 1.15 V VIL Low-level input voltage low VREG18 = 1.8 V 0.50 V VOL Output voltage low for INT/PULS VREG18 = 1.8 V, IOL = 1 mA 0.4 V CI Input capacitance 5 pF Ilkg Input leakage current 1 µA 7.8 Internal Temperature Sensor Unless otherwise noted, characteristics noted under conditions of TA = –40 to 85℃ PARAMETER TEST CONDITIONS MIN TYP MAX UNIT V(TEMP) Internal Temperature sensor voltage drift VTEMPP 1.65 1.73 1.8 mV/°C VTEMPP – VTEMPN (assured by design) 0.17 0.18 0.19 7.9 NTC Thermistor Measurement Support Unless otherwise noted, characteristics noted under conditions of TA = –40 to 85℃ PARAMETER TEST CONDITIONS MIN TYP MAX UNIT RNTRC(PU) Internal Pullup Resistance 14.4 18 21.6 kΩ RNTC(DRIFT) Resistance drift over temperature –250 –120 0 PPM/°C 7.10 Coulomb Counter (CC) Unless otherwise noted, characteristics noted under conditions of TA = –40 to 85℃ PARAMETER TEST CONDITIONS MIN TYP MAX UNIT V(CC_IN) Input voltage range –0.1 0.1 V t(CC_CONV) Conversion time Single conversion 1000 ms Effective Resolution 1 LSB 3.8 µV Integral nonlinearity 16-bit, Best fit over input voltage range –22.3 5.2 +22.3 LSB Differential nonlinearity 16-bit, No missing codes 1.5 LSB Offset error 16- bit Post-Calibration –2.6 1.3 +2.6 LSB Offset error drift 15-bit + sign, Post Calibration 0.04 0.07 LSB/°C Gain Error 15-bit + sign, Over input voltage range –492 131 +492 LSB |
|
|
链接网址 |
| ALLDATASHEET是否为您带来帮助? [ DONATE ] |
关于 Alldatasheet | 广告服务 | 联系我们 | 隐私政策 | 数据表链接 | 链接交换 | 制造商名单 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
Chinese ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
