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ADF41513 数据表(PDF) 13 Page - Analog Devices |
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ADF41513 数据表(HTML) 13 Page - Analog Devices |
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13 / 30 page ![]() Data Sheet ADF41513 Rev. 0 | Page 13 of 30 The window size can be adjusted between 0.9 ns and 11.5 ns with LDP, Bits[9:8] in Register 6 and LD bias, Bits[31:30] in Register 9. The ideal window size is halfway between the maximum window, set by the phase comparison period, tPFD (10 ns for 100 MHz reference and R = 1), and the minimum is set by (IBLEED/ICP) × tPFD (4) LD_COUNT can range from 2 counts to 8192 counts. The fastest lock indication requires two measurement cycles (20 ns with 100 MHz reference, R = 1, and LD_CLK_SEL = 0). In practice, the lock indication takes much longer because of the loop filter on the phase comparator. When LD_CLK_SEL = 1, a minimum 64 measurements are required (640 ns). READBACK Register data can be read by setting MUXOUT to serial data output. In this mode, the MUXOUT line concurrently transfers 32 bits of the previous written register value while clocking in 32 bits of write data. To read back a specific register, chip revision code, or bit pattern, write 1000b to Bits[31:28], Register 12. Bits[19:14] in Register 12 set the data that is output from the MUXOUT pin when in readback mode. To prevent spurious writes, the DATA pin must be held at logic low while a readback is taking place. INPUT SHIFT REGISTERS The ADF41513 contains a programmable digital block. Data is clocked into the 32-bit shift register on each rising edge of CLK. The data is clocked in MSB first. Data is transferred from the shift register to the chosen register on the rising edge of LE. The destination latch is determined by the state of the four control bits (C4, C3, C2, and C1) in the shift register. The following are the four LSBs: DB3, DB2, DB1, and DB0. The truth table for these bits is shown in Table 6. Figure 20 through Figure 22 show a summary of how the registers are programmed. PROGRAM MODES Table 6 and Figure 23 through Figure 36 show how to set up the program modes in the ADF41513. Several settings in the ADF41513 are double buffered. These settings include MOD2, FRAC1, FRAC2, R counter value, reference doubler, CP current setting, RDIV2, phase word, prescaler, and CLK1 divider. Two events must occur before the device uses a new value for any of the double buffered settings. First, the new value is latched into the device by writing to the appropriate register. Second, a new write must be performed on Register 0. For example, updating the FRAC1 value requires a write to Register 1 and a write to Register 0. Write to Register 1 first, followed by the write to Register 0. The frequency change begins after the write to Register 0. Double buffering ensures that the bits written to Register 1 do not take effect until after the write to Register 0. Table 6. C4, C3, C2, and C1 Truth Table Control Bits C4 C3 C2 C1 Register 0 0 0 0 R0 0 0 0 1 R1 0 0 1 0 R2 0 0 1 1 R3 0 1 0 0 R4 0 1 0 1 R5 0 1 1 0 R6 0 1 1 1 R7 1 0 0 0 R8 1 0 0 1 R9 1 0 1 0 R10 1 0 1 1 R11 1 1 0 0 R12 1 1 0 1 R13 |
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