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PLL602-03
Low Phase Noise CMOS XO (48MHz to 100MHz)
47745 Fremont Blvd., Fremont, California 94538 Tel (510) 492-0990 Fax (510) 492-0991 www.phaselink.com Rev 09/03/04 Page 3
3. AC Specifications
PARAMETERS
SYMBOL
CONDITIONS
MIN.
TYP.
MAX.
UNITS
Input Crystal Frequency
12
25
MHz
Output Clock Rise/Fall Time
(Standard Drive)
0.3V ~ 3.0V with 15 pF load
2.4
Output Clock Rise/Fall Time
(High Drive)
0.3V ~ 3.0V with 15 pF load
1.2
ns
Output Clock Duty Cycle
Measured @ 50% VDD
45
50
55
%
4. Jitter and Phase Noise Specification
PARAMETERS
CONDITIONS
MIN.
TYP.
MAX.
UNITS
RMS Period Jitter
(1 sigma – 1000 samples)
at 80MHz, with capacitive decoupling
between VDD and GND.
3.5
ps
Phase Noise relative to carrier
80MHz @100Hz offset
-103
dBc/Hz
Phase Noise relative to carrier
80MHz @1kHz offset
-122
dBc/Hz
Phase Noise relative to carrier
80MHz @10kHz offset
-130
dBc/Hz
Phase Noise relative to carrier
80MHz @100kHz offset
-125
dBc/Hz
5. Crystal Specifications
PARAMETERS
SYMBOL
MIN.
TYP.
MAX.
UNITS
Crystal Resonator Frequency
FXIN
12
25
MHz
Crystal Loading Capacitance Rating
CL (xtal)
20
pF
Driving power
1
mW
ESR
RS
30
Ω
PACKAGE INFORMATION
C
L
A
8 PIN ( dimensions in mm )
Narrow SOIC
Symbol
Min.
Max.
A
1.47
1.73
A1
0.10
0.25
B
0.33
0.51
C
0.19
0.25
D
4.80
4.95
E
3.80
4.00
H
5.80
6.20
L
0.38
1.27
e
1.27 BSC
E
H
D
A1
e
B
TSSOP
Min.
Max.
-
1.20
0.05
0.15
0.19
0.30
0.09
0.20
2.90
3.10
4.30
4.50
6.20
6.60
0.45
0.75
0.65 BSC