51

MLCC Tin/Lead Termination “B”

Parameter/Test

X5R Specification Limits

Measuring Conditions

Operating Temperature Range

-55ºC to +85ºC

Temperature Cycle Chamber

Capacitance

Within specified tolerance

Freq.: 1.0 kHz ± 10%

Voltage: 1.0Vrms ± .2V

For Cap > 10 μF, 0.5Vrms @ 120Hz

Dissipation Factor

≤ 2.5% for ≥ 50V DC rating

≤ 3.0% for 25V, 35V DC rating

≤ 12.5% Max. for 16V DC rating and lower Contact

Factory for DF by PN

Insulation Resistance

10,000MΩ or 500MΩ - μF,

whichever is less

Charge device with rated voltage for

120 ± 5 secs @ room temp/humidity

Dielectric Strength

No breakdown or visual defects

Charge device with 250% of rated voltage for

1-5 seconds, w/charge and discharge current

limited to 50 mA (max)

Resistance to

Flexure

Stresses

Appearance

No defects

Deflection: 2mm

Test Time: 30 seconds

Capacitance

Variation

≤ ±12%

Dissipation

Factor

Meets Initial Values (As Above)

Insulation

Resistance

≥ Initial Value x 0.3

Solderability

≥ 95% of each terminal should be covered

with fresh solder

Dip device in eutectic solder at 230 ± 5ºC

for 5.0 ± 0.5 seconds

Resistance to

Solder Heat

Appearance

No defects, <25% leaching of either end terminal

Dip device in eutectic solder at 260ºC for 60

seconds. Store at room temperature for 24 ± 2

hours before measuring electrical properties.

Capacitance

Variation

≤ ±7.5%

Dissipation

Factor

Meets Initial Values (As Above)

Insulation

Resistance

Meets Initial Values (As Above)

Dielectric

Strength

Meets Initial Values (As Above)

Thermal Shock

Appearance

No visual defects

Step 1: -55ºC ± 2º

30 ± 3 minutes

Capacitance

Variation

≤ ±7.5%

Step 2: Room Temp

≤ 3 minutes

Dissipation

Factor

Meets Initial Values (As Above)

Step 3: +85ºC ± 2º

30 ± 3 minutes

Insulation

Resistance

Meets Initial Values (As Above)

Step 4: Room Temp

≤ 3 minutes

Dielectric

Strength

Meets Initial Values (As Above)

Repeat for 5 cycles and measure after

24 ± 2 hours at room temperature

Load Life

Appearance

No visual defects

Charge device with 1.5X rated voltage in test

chamber set at 85ºC ± 2ºC for 1000 hours

(+48, -0). Note: Contact factory for *optional

specification part numbers that are tested at

< 1.5X rated voltage.

Remove from test chamber and stabilize at room

temperature for 24 ± 2 hours before measuring.

Capacitance

Variation

≤ ±12.5%

Dissipation

Factor

≤ Initial Value x 2.0 (See Above)

Insulation

Resistance

≥ Initial Value x 0.3 (See Above)

Dielectric

Strength

Meets Initial Values (As Above)

Load

Humidity

Appearance

No visual defects

Store in a test chamber set at 85ºC ± 2ºC/ 85% ±

5% relative humidity for 1000 hours

(+48, -0) with rated voltage applied.

Remove from chamber and stabilize at room

temperature and humidity for

24 ± 2 hours before measuring.

Capacitance

Variation

≤ ±12.5%

Dissipation

Factor

≤ Initial Value x 2.0 (See Above)

Insulation

Resistance

≥ Initial Value x 0.3 (See Above)

Dielectric

Strength

Meets Initial Values (As Above)

112916

Specifications and Test Methods

X5R –