Nexperia

PCMFxUSB3S series

Common-mode EMI filter for differential channels with integrated ESD protection

0

25

20

10

15

5

aaa-019781

10

15

5

20

25

I

(A)

0

Transmission Line Pulse (TLP) = 100 ns;

Fig. 17. Dynamic resistance with positive clamping;

typical values

-25

0

-5

-15

-10

-20

aaa-019782

-15

-10

-20

-5

0

I

(A)

-25

Transmission Line Pulse (TLP) = 100 ns;

Fig. 18. Dynamic resistance with negative clamping;

typical values

0

25

20

10

15

5

aaa-021984

10

15

5

20

25

I

(A)

0

Very-Fast Transmission Line Pulse

(VF-TLP) = 5 ns;

Fig. 19. Dynamic resistance with positive clamping;

typical values

-25

0

-5

-15

-10

-20

aaa-021983

-15

-10

-20

-5

0

I

(A)

-25

Very-Fast Transmission Line Pulse

(VF-TLP) = 5 ns;

Fig. 20. Dynamic resistance with negative clamping;

typical values

The device uses an advanced clamping structure showing a negative dynamic resistance.

This snap-back behavior strongly reduces the clamping voltage to the system behind the ESD

protection during an ESD event. Do not connect unlimited DC current sources to the data lines to

avoid keeping the ESD protection device in snap-back state after exceeding breakdown voltage

(due to an ESD pulse for instance).

PCMFXUSB3S_SER

All information provided in this document is subject to legal disclaimers.

Product data sheet

Rev. 3 — 7 March 2019

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