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M68AF511AL 数据表(PDF) 10 Page - STMicroelectronics |
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M68AF511AL 数据表(HTML) 10 Page - STMicroelectronics |
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10 / 18 page ![]() M68AF511AL 10/18 Table 7. Read and Standby Mode AC Characteristics Note: 1. Test conditions assume transition timig reference level = 0.3VCC or 0.7VCC. 2. At any given temperature and voltage condition, tEHQZ is less than tELQX and tGHQZ is less than tGLQX for any given device. 3. These parameters are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage levels. 4. Tested initially and after any design or process changes that may affect these parameters Symbol Parameter M68AF511AL Unit 55 70 tAVAV Read Cycle Time Min 55 70 ns tAVQV Address Valid to Output Valid Max 55 70 ns tAXQX (1) Data hold from Address change Min 5 5 ns tEHQZ (2,3) Chip Enable High to Output Hi-Z Max 20 25 ns tELQV Chip Enable Low to Output Valid Max 55 70 ns tELQX (1) Chip Enable Low to Output Transition Min 5 5 ns tGHQZ (2,3) Output Enable High to Output Hi-Z Max 20 25 ns tGLQV Output Enable Low to Output Valid Max 25 35 ns tGLQX (1) Output Enable Low to Output Transition Min 5 5 ns tPD (4) Chip Enable High to Power Down Max 0 0 ns tPU (4) Chip Enable Low to Power Up Min 55 70 ns |
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