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RF-RUB170TS-BD 数据表(PDF) 13 Page - SHENZHEN REFOND OPTOELECTRONICS CO.,LTD. |
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RF-RUB170TS-BD 数据表(HTML) 13 Page - SHENZHEN REFOND OPTOELECTRONICS CO.,LTD. |
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13 / 21 page ![]() Tel: +86-755-66839118 Fax:+86-755-66839300 E-mail:sales@refond.com Web: www.refond.com PAGE:13 REFOND:WI-E-045 A/3 REV:E/2 TG-201702280167EP 2.3 Cardboard Box Fig.2-5 Cardboard Box 2.4 Reliability Test Items And Conditions Table 2-3 Reliability Test Items And Conditions Test Items Ref.Standard Test Condition Time Quantity Ac/Re / Reflow JESD22-B106 Temp:260 max T=10 sec 2 times 22Pcs. 0/1 Temperature Cycle JESD22-A104 100 30 min ↑↓5 min -40 30 min 100 cycles 22Pcs. 0/1 Thermal Shock JESD22-A106 -40 15min ↑↓ 100 15min 300 cycles 22Pcs. 0/1 High Temperature Storage JESD22-A103 Temp:100 1000 hrs. 22Pcs. 0/1 Low Temperature Storage JESD22-A119 Temp:-40 1000 hrs. 22Pcs. 0/1 Life Test JESD22-A108 Ta=25 IF=20mA 1000 hrs. 22Pcs. 0/1 深圳市瑞丰光电子股份有限公司 SHENZHEN REFOND OPTOELECTRONICS CO.LTO. |
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