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HCF4013 数据表(PDF) 7 Page - STMicroelectronics |
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HCF4013 数据表(HTML) 7 Page - STMicroelectronics |
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7 / 13 page ![]() DocID2023 Rev 4 7/13 HCF4013 Electrical characteristics 13 Table 7. Dynamic electrical characteristics (Tamb = 25 °C, CL = 50 pF, RL = 200 kΩ, tr = tf = 20 ns) Symbol Parameter Test condition Value(1) 1. The typical temperature coefficient for all VDD values is 0.3 %/°C. Unit VDD (V) Min. Typ. Max. tTLH, tTHL Propagation delay time (CLOCK to Q or Q outputs) 5150 300 ns 10 65 130 15 45 90 tPLH Propagation delay time (SET to Q or RESET to Q) 5150 300 10 65 130 15 45 90 tPHL Propagation delay time (SET to Q or RESET to Q) 5200 400 10 85 170 15 60 120 tTHL, tTLH Transition time 5100 200 10 50 100 15 40 80 fCL(2) 2. Input tr, tf = 5 ns Maximum clock input frequency 53.5 7 MHz 10 8 16 15 12 24 tW Clock pulse width 5140 70 ns 10 60 30 15 40 20 Set or reset pulse width 5180 90 10 80 40 15 50 25 tr , tf (3) 3. If more than one unit is cascaded in a parallel clocked application, tr should be made less than or equal to the sum of the fixed propagation delay time at 15 pF and the transition time of the carry output driving stage for the estimated capacitive load. Clock input rise or fall time 515 μs 10 4 15 1 ts Data setup time 540 20 ns 10 20 10 15 15 7 |
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