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PR533 数据表(PDF) 6 Page - NXP Semiconductors |
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PR533 数据表(HTML) 6 Page - NXP Semiconductors |
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6 / 36 page ![]() PR533_SDS All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved. Product short data sheet COMPANY PUBLIC Rev. 3.6 — 27 October 2014 206436 6 of 36 NXP Semiconductors PR533 USB NFC integrated reader solution OSCIN 15 I AVDD crystal oscillator input: input to the inverting amplifier of the oscillator. This pin is also the input for an externally generated clock (fclk = 27.12 MHz). OSCOUT 16 O AVDD crystal oscillator output: output of the inverting amplifier of the oscillator. I0 17 I DVDD interface mode lines: selects the used host interface; in test mode I0 is used as test signals. I1 18 I DVDD TESTEN 19 I DVDD test enable pin: when set to 1 enable the test mode. when set to 0 reset the TCB and disable the access to the test mode. P35 20 I/O DVDD general purpose I/O signal P70_IRQ 21 I/O PVDD interrupt request: output to signal an interrupt event to the host (Port 7 bit 0) RSTOUT_N 22 O PVDD output reset signal; when LOW it indicates that the circuit is in reset state. DVSS 23 G digital ground DM 24 I/O PVDD USB D data line in USB mode or TX in HSU mode; in test mode this signal is used as input and output test signal DP 25 I/O PVDD USB D+ data line in USB mode or RX in HSU mode; in test mode this signal is used as input and output test signal. PVDD 26 P I/O pad power supply DELATT 27 O PVDD optional output for an external 1.5 k resistor connection on D+. P30 28 I/O PVDD general purpose I/O signal. Can be configured to act either as RX line of the second serial interface UART or general purpose I/O. In test mode this signal is used as input and output test signal. P31 29 I/O PVDD general purpose I/O signal. Can be configured to act either as TX line of the second serial interface UART or general purpose I/O. In test mode this signal is used as input and output test signal. P32_INT0 30 I/O PVDD general purpose I/O signal. Can also be used as an interrupt source In test mode this signal is used as input and output test signal. P33_INT1 31 I/O PVDD general purpose I/O signal. Can be used to generate an HZ state on the out- put of the selected interface for the Host communication and to enter into power-down mode without resetting the internal state of PR533. In test mode this signal is used as input and output test signal. P50_SCL 32 I/O DVDD I2C-bus clock line - open-drain in output mode SDA 33 I/O DVDD I2C-bus data line - open-drain in output mode P34 34 I/O SVDD general purpose I/O signal or clock signal for the SAM SIGOUT 35 O SVDD contactless communication interface output: delivers a serial data stream according to NFCIP-1 and output signal for the SAM. In test mode this signal is used as test signal output. SIGIN 36 I SVDD contactless communication interface input: accepts a digital, serial data stream according to NFCIP-1 and input signal from the SAM. In test mode this signal is used as test signal input. SVDD 37 P output power for SAM power supply. Switched on by Firmware with an over- load detection. Used as a reference voltage for SAM communication. Table 3. PR533 pin description …continued Symbol Pin Type Pad ref voltage Description |
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