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TS650CS 数据表(PDF) 2 Page - Taiwan Semiconductor Company, Ltd

部件名 TS650CS
功能描述  Buck Switching Regulator
PDF  4 Pages
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制造商  TSC [Taiwan Semiconductor Company, Ltd]
网页  http://www.taiwansemi.com
标志 TSC - Taiwan Semiconductor Company, Ltd

TS650CS 数据表(HTML) 2 Page - Taiwan Semiconductor Company, Ltd

  TS650CS Datasheet HTML 1Page - Taiwan Semiconductor Company, Ltd TS650CS Datasheet HTML 2Page - Taiwan Semiconductor Company, Ltd TS650CS Datasheet HTML 3Page - Taiwan Semiconductor Company, Ltd TS650CS Datasheet HTML 4Page - Taiwan Semiconductor Company, Ltd  
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TS650
2-4
2003/12 rev. A
Absolute Maximum Rating
Supply Voltage
VCC
30
V
Comparator Input Voltage Range
VFB
- 0.3 ~ 30
V
Collector Output Voltage
VC(SW)
30
V
Collector to Emitter Voltage
VCE(SW)
30
V
Output Switching Current
ISW
500
mA
Operating Junction Temperature Range
TJ
-20 ~ +125
oC
Storage Temperature Range
TSTG
-65 ~ +150
oC
Lead Temperature 1.6mm(1/16”) from case for 10Sec.
TLEAD
260
oC
Electrical Characteristics
(VCC =5V, Ta =25
oC; unless otherwise specified.)
Parameter
Symbol
Test Conditions
Min
Typ
Max
Unit
Reference
Comp. Connect to FB
1.23
1.25
1.27
V
Ta= -20
oC ~ 25 oC
- 0.1
1
Output voltage change with
temperature
VREF
Ta= 25
oC ~ 85 oC
- 0.2
1
%
Line regulation
RegLine
VCC = 5V ~ 30V
5
mV
Output switch (note1)
Saturation Voltage
VCE(SAT)
ISW =0.5A
1.0
1.2
V
DC current gain
HFE
ISW =1A, Vce=0.5V
75
--
Collector off-state current
IC(OFF)
Vce=30V
40
100
uA
Oscillator (OSC)
Frequency
FOSC
CT = 1nF, Vpin5=0V
24
33
42
KHz
Charge Current
ICHARGE
VCC = 5V ~ 30V
35
uA
Discharge Current
IDISCHARGE
VCC = 5V ~ 30V
220
uA
Discharge to Charge current ratio
IDISCHARGE
/ ICHARGE
Pin7 to Vcc
6.5
--
Current Limit Sense Voltage
VIPK(SENSE)
IDISCHARGE = ICHARGE
250
350
mV
ON/OFF driver control
ON driver voltage
Von
4
5
V
OFF driver voltage
Voff
1
V
ON driver current
Ion
VCC = 3V ~ 30V
100
mA
Total device
supply current
ICC
VCC = 5V ~ 30V, CT = 1nF,
pin7=Vcc, pin5>Vth,
pin2=Gnd, remaining pins
open
3
5
mA
Input bias current
IIB
Vin=0V
-400
nA
Note 1: Low duty cycle pulse techniques are used during test to maintain junction temperature as close to ambient
temperature.



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