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ELECTRICAL CHARACTERISTICS
Low Temperature
exposure
△R :
±(3%+0.1Ω) of the initial value.
Visual : No evidence of mechanical damage.
Dwell in -55
℃ chamber without loading for 1000±12 hours
Dwell for 60 minutes at Room temperature and
Measure resistance value.
Temperature Cycle
△R :
±(1%+0.1Ω) of the initial value.
Visual : No evidence of mechanical damage.
Perform 100Cycles as follows.
Load Life in
Moisture
Temperature : 40
±2℃
RH : 90~95%
Applying rated voltage for 90 minutes “ON” and
30minutes”OFF”
Duration : 1000 hours
Dwell in Room temperature for 1 hour and measure
resistance value.
No.
Temperature(
℃)
Time(min)
1
-55
±3
30
2
20
±3
15
3
125
±3
30
4
20
±3
15
Item
Specification
Test Method
T
TH
HIIC
CK
K F
FIIL
LM
M C
CH
HIIP
P R
RE
ES
SIIS
ST
TO
OR
RS
S
At R
10
Ω△R :
±5%
At R
1
㏁△R :
±(3% + 0.1Ω)
At R
1
㏁△R :
±5%
Visual : No evidence of mechanical damage.
Load Life in high
Temperature
Temperature : 70
±3℃ at rated voltage.
Applying rated voltage for 90 minutes “ON” and
30minutes”OFF”
Duration : 1000 hours
Dwell in Room temperature for 1 hour and measure
resistance value.
At R
10
Ω△R :
±5%
At R
1
㏁△R :
±(3% + 0.1Ω)
At R
1
㏁△R :
±5%
Heat Resistance
(High Temperature
Exposure)
Dwell in 125
±3℃ chamber without loading for
1000
±12 hours
Dwell in Room temperature for 1 hour and measure
resistance value.
△R :
±(3%+0.1Ω) of the initial value.
Visual : No evidence of mechanical damage.
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