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ASM2I9940L 数据表(PDF) 7 Page - Alliance Semiconductor Corporation |
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ASM2I9940L 数据表(HTML) 7 Page - Alliance Semiconductor Corporation |
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7 / 13 page ![]() June 2005 ASM2I9940L rev 1.0 Low Voltage 1:18 Clock Distribution Chip 7 of 13 Notice: The information in this document is subject to change without notice. Figure 1. LVCMOS_CLK ASM2I9940L AC Test Reference for VCC = 3.3V and VCC = 2.5V VTT VTT Figure 2. PECL_CLK ASM2I9940L AC Test Reference for VCC = 3.3V and VCC = 2.5V VCC ÷2 GND Figure 3. Propagation Delay (tPD) Test Reference PECL_CLK Q VPP VCMR VCC tPD PECL_CLK VCC ÷2 GND VC LVCMOS_CLK Q VC tPD VCC ÷2 GND Figure 4. LVCMOS Propagation Delay (tPD) Test Reference The time from the PLL controlled edge to the non-controlled edge, divided by the time between PLL controlled edges, expressed as a percentage. VCC VCC ÷2 GND DC (tP ÷T0 Χ 100%) tP T0 Figure 5. Output Duty Cycle (DC) tSK(O) VOH VCC ÷2 GND VCC VCC ÷2 GND The pin-to-pin skew is defined as the worst case difference in propagation delay between any similar delay path within a single device Figure 6. Output–to–Output Skew tSK(O) tR VCC = 3.3V VCC = 2.5V 2.4 1.8V 0.55 0.6V tF Figure 7. Output Transition Time Test Reference tR VCC = 3.3V VCC = 2.5V 2.0 1.7V 0.8 0.7V tF Figure 8. Input Transition Time Test Reference Pulse Generator Z=50 Ω Z0=50Ω Z0=50Ω RT=50Ω RT=50Ω VTT ASM2I9940L Differential Pulse Generator Z=50 Ω Z0=50Ω Z0=50Ω RT = 50Ω VTT RT=50Ω ASM2I9940L |
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