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MTC20454

Test

Four different test modes are implemented. The functional test mode allows separate access to different

analog parts of the circuit in order to check some characteristics. Various test configurations are available

via the CTRLIN interface.

The digital core scan and the I/O nand tree test modes are dedicated for the detection of hardware process

flaws in digital elements and IOs.

The last test mode allows to put the outputs in the tristate mode in order to be able to perform the ESD

qualification tests.

Test is enabled with a high level n the TEST pin. The actual value of TX1 and TX0 bits on the rising edge

of the TEST pin will set the test mode.

The available test modes and their corresponding signal values are summarized in the following table:

Table 6. Tests mode accessMTC20454

TX1

TX0

Test Mode

0

0

functional test (enable various tests accesses via CTRLIN interface

0

1

digital scan chain test

1

0

I/O nand tree

1

1

Tristate output for ESD