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MKP385E24712API2B/T0 数据表(PDF) 25 Page - Vishay Siliconix |
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MKP385E24712API2B/T0 数据表(HTML) 25 Page - Vishay Siliconix |
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25 / 28 page ![]() MKP385e www.vishay.com Vishay BCcomponents Revision: 28-May-2019 25 Document Number: 28255 For technical questions, contact: dc-film@vishay.com THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000 SUB-GROUP C3A 4.12.1 Endurance Duration: 2000 h Temperature: 85 °C Voltage: 1.25 x URAC VRMS, 50 Hz AND Duration: 2000 h Temperature: 105 °C Voltage: 0.875 x URAC VRMS, 50 Hz 4.12.1.1 Initial measurements Capacitance Tangent of loss angle C 1 μF at 100 kHz 1 μF < C 10 μF at 10 kHz 4.12.1.3 Final measurements Visual examination No visible damage Legible marking Capacitance l C/Cl 5 % for C > 10 nF l C/Cl 8 % for C 10 nF Compared to values measured in 4.12.1.1 Tangent of loss angle Increase of tan : 0.0005 for: C 100 nF at 100 kHz 0.0010 for: 100 nF < C 470 nF at 100 kHz 0.0015 for: 470 nF < C 1 μF at 100 kHz 0.0015 for 1 μF < C 10 μF at 10 kHz Compared to values measured in 4.12.1.1 Insulation resistance 50 % of values specified in section “Insulation resistance” of this specification. SUB-GROUP C3B 4.12.2 Endurance test at 50 Hz alternating voltage 0.625 x URAC at 125 °C 500 h 4.12.2.1 Initial measurements Capacitance Tangent of loss angle: C 1 μF at 100 kHz 1 μF < C 10 μF at 10 kHz 4.12.2.3 Final measurements Visual examination No visible damage Legible marking Capacitance l C/Cl ≤ 10 % + 100 pF compared to values measured in 4.12.2.1 Tangent of loss angle Increase of tan : 0.0005 for: C 100 nF at 100 kHz 0.0010 for: 100 nF < C 470 nF at 100 kHz 0.0015 for: 470 nF < C 1 μF at 100 kHz 0.0015 for: 1 μF < C 10 μF at 10 kHz Compared to values measured in 4.12.2.1 Insulation resistance 50 % of values specified in section “Insulation Resistance” of this specification. IEC 60384-17 - FIXED METALLIZED POLYPROPYLENE FILM DIELECTRIC AC AND PULSE CAPACITORS SUB-CLAUSE NUMBER AND TEST CONDITIONS PERFORMANCE REQUIREMENTS |
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