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TSB571ILT 数据表(PDF) 19 Page - STMicroelectronics |
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TSB571ILT 数据表(HTML) 19 Page - STMicroelectronics |
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19 / 31 page ![]() ∆Vio Viodrift month s ( ) = Where Vio drift is the measured drift value in the specified test conditions after 1000 h stress duration. 4.6 Capacitive load Driving large capacitive loads can cause stability problems. Increasing the load capacitance produces gain peaking in the frequency response, with overshoot and ringing in the step response. It is usually considered that with a gain peaking higher than 2.3 dB an op amp might become unstable. Generally, unity gain configuration is the worst situation for stability and the ability to drive large capacitive loads. Figure 38. Stability criteria with a serial resistor at different supply voltages shows the serial resistor that must be added to the output, to make a system stable. Figure 39. Test configuration for Riso shows the test configuration using an isolation resistor, Riso. Figure 37. Stability criteria with a serial resistor at different supply voltages 10 2 10 3 10 4 10 5 10 6 0.1 1 10 100 @Vcc=4V @Vcc=12V @Vcc=36V Stable Vcc=36V Vicm=18V follower configuration T=25°C Capacitive load (pF) Unstable Figure 38. Test configuration for Riso Cload VIN + - VCC+ Riso 10 kΩ VCC- VOUT 4.7 PCB layout recommendations Particular attention must be paid to the layout of the PCB tracks connected to the amplifier, load, and power supply. The power and ground traces are critical as they must provide adequate energy and grounding for all circuits. The best practice is to use short and wide PCB traces to minimize voltage drops and parasitic inductance. In addition, to minimizing parasitic impedance over the entire surface, a multi-via technique that connects the bottom and top layer ground planes together in many locations is often used. The copper traces that connect the output pins to the load and supply pins should be as wide as possible to minimize trace resistance. TSB571, TSB572 Capacitive load DS11248 - Rev 7 page 19/31 |
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