TMS320F2811PBKA datasheet(13/175 Pages) TI

13 / 175 page

Table 7-1. Signal Descriptions (continued)

NAME

PIN NO. (1)

I/O/Z(2)

PU/PD(3)

DESCRIPTION

179-BALL

GHH/ZHH

176-PIN

PGF

128-PIN

PBK

JTAG

TRST

B12

135

JTAG test reset with internal pulldown. TRST,

when driven high, gives the scan system

control of the operations of the device. If this

signal is not connected or driven low, the

device operates in its functional mode, and the

test reset signals are ignored. NOTE: Do not

use pullup resistors on TRST; it has an internal

pulldown device. TRST is an active-high test

pin and must be maintained low at all times

during normal device operation. In a low-noise

environment, TRST may be left floating. In

other instances, an external pulldown resistor is

highly recommended. The value of this resistor

should be based on drive strength of the

debugger pods applicable to the design. A 2.2-

kΩ resistor generally offers adequate

protection. Since this is application-specific, it is

recommended that each target board be

validated for proper operation of the debugger

and the application.

TCK

A12

136

JTAG test clock with internal pullup

TMS

D13

126

JTAG test-mode select (TMS) with internal

pullup. This serial control input is clocked into

the TAP controller on the rising edge of TCK.

TDI

C13

131

JTAG test data input (TDI) with internal pullup.

TDI is clocked into the selected register

(instruction or data) on a rising edge of TCK.

TDO

D12

127

O/Z

–

JTAG scan out, test data output (TDO). The

contents of the selected register (instruction or

data) is shifted out of TDO on the falling edge

of TCK.

EMU0

D11

137

100

I/O/Z

Emulator pin 0. When TRST is driven high, this

pin is used as an interrupt to or from the

emulator system and is defined as input/output

through the JTAG scan. This pin is also used to

put the device into boundary-scan mode. With

the EMU0 pin at a logic-high state and the

EMU1 pin at a logic-low state, a rising edge on

the TRST pin would latch the device into

boundary-scan mode. NOTE: An external

pullup resistor is recommended on this pin. The

value of this resistor should be based on the

drive strength of the debugger pods applicable

to the design. A 2.2-kΩ to 4.7-kΩ resistor is

generally adequate. Since this is application-

specific, it is recommended that each target

board be validated for proper operation of the

debugger and the application.

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TMS320F2810, TMS320F2810-Q1, TMS320F2811, TMS320F2811-Q1

TMS320F2812, TMS320F2812-Q1

SPRS174V – APRIL 2001 – REVISED FEBRUARY 2021

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