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ADA4570BRZ-R7 数据表(PDF) 11 Page - Analog Devices |
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ADA4570BRZ-R7 数据表(HTML) 11 Page - Analog Devices |
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11 / 14 page ![]() Data Sheet ADA4570 APPLICATIONS INFORMATION analog.com Rev. 0 | 11 of 14 The ADA4570 is designed for magnetoresistive sensing applica- tions with a differential analog output. The sensor is designed to operate with an external ADC that is controlled by a separate processing IC or electronic control unit (ECU) as indicated in Figure 18. SUPPLY AND ADC REFERENCE Connect a decoupling capacitance of 100 nF to the ADA4570 VDD supply pin to minimize interferences on the power supply from entering the system. To achieve optimum power supply related noise performance, connect the VDD supply of the ADA4570 as the voltage reference of the ADC, as shown in Figure 18. Using the ADA4570 VDD supply as the reference input voltage to the external ADC provides a ratiometric configuration where the output dependency on the supply voltage changes is minimized. This con- figuration also optimizes the use of the ADC input range because the output voltages of the VSIN+, VSIN−, VCOS+, and VCOS− pins track the supply voltage. CONNECTING THE ADA4570 A typical circuit to connect the ADA4570 to a differential ADC is shown in Figure 18. The ADA4570 signal driving capability is sufficient to connect the analog outputs directly to a differential successive approximation register (SAR) or a Σ-Δ ADC. Minimize the signal trace lengths to the ADC or the processing IC. Using proper layout techniques and ground planes around the analog signal tracks provides shielding on the PCB and im- proves electromagnetic compatibility (EMC) robustness. For each differential output, the load resistor (RL) and the single-ended load capacitance (CL/2) must refer to ground, and the differential load capacitance (CL/4) must be connected between the differential outputs (see Figure 18.). The load resistors and capacitors must match to achieve the best angular accuracy. In addition, take the desired system sampling frequency into account when adding noise reducing filters to the front of the ADC. ANGLE CALCULATION The angle of the incident magnetic field is calculated from the out- put of the ADA4570, and the trigonometric function arctangent(2) (arctan2) is used. To calculate the ADA4570 output angle, use the following equation: α = arctan2(VSIN/VCOS)/2 With the sensing range of the AMR sensor, the calculated angle repeats every 180° rotation of the magnetic field. For a dipole magnet, the ADA4570 reports an angle with twice the frequency of the rotation. The direction of a homogeneous magnetic field for an angle of α = 0°is shown in Figure 19 Figure 19. Direction of Homogeneous Magnetic Field for α = 0° SIGNAL DEPENDENCE ON AIR GAP DISTANCE The ADA4570 measures the direction of the external magnetic field within the sensor x-y plane. Within a homogeneous field in the xy direction, where the magnetic flux density is at least 30 mT, the accuracy and voltage levels of the angular measurement is independent of the field strength and the sensor placement in z direction (air gap). The nominal z distance of the internal x-y plane to the top surface of the plastic package is shown in Figure 22. SIGNAL OFFSET AND CALIBRATION The ADA4570 provides two differential output signals, VSIN and VCOS, with an output voltage range of ±VAMP (see Figure 15). Matching inaccuracies and other imperfections during the produc- tion process may result in offsets in the outputs. To minimize additional offsets, caused by the external filter components, match the external capacitive and resistive loads to each other by using the same nominal values for the external components connected to VSIN+, VSIN−, VCOS+, and VCOS−. To calculate the offset, use the positive and negative VAMP value of a full magnetic rotation as follows: VOFFSET = (VAMP_POS + VAMP_NEG)/2 The VSIN and VCOS output offset can be removed by subtracting the calculated offsets VOFFSET(VSIN)and VOFFSET(VCOS) from the VSIN and VCOS measurement result. A single point calibration is usually done at 25°C and removes the system offset at this temperature. This simple calibration does not take temperature related offset drifts into account that may be caused by drifts within the internal or external components. This calibration may be sufficient for many applications in particular where no large changes in temperature are expected. To compen- sate for offset drifts over the full temperature range, dynamic offset calibrations are required. |
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